Dynamical Franz-Keldysh Effect in Diamond in the Deep Ultraviolet Probed by Transient Absorption and Dispersion Spectroscopy Using a Miniature Beamline von Reislöhner, Jan, Chen, Xiao, Kim, Doyeong, Botti, Silvana, Pfeiffer, Adrian N.

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Onset of Bloch oscillations in the almost-strong-field regime von Reislöhner, Jan, Kim, Doyeong, Babushkin, Ihar, Pfeiffer, Adrian N.

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Characterization of weak deep ultraviolet pulses using cross-phase modulation scans von Reislöhner, Jan, Leithold, Christoph, Pfeiffer, Adrian N

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Characterization of two ultrashort laser pulses using interferometric imaging of self-diffraction von Leithold, Christoph, Reislöhner, Jan, Gies, Holger, Pfeiffer, Adrian N

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Characterization of over-octave-spanning laser pulses using interferometric imaging of self-diffraction von Leithold, Christoph, Reislöhner, Jan, Aguillón, Jesús Delgado, Pfeiffer, Adrian N.

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The role of delay times in subcycle-resolved probe retardation measurements von Reislöhner, Jan, Pfeiffer, Adrian N.

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Harmonic Concatenation of 1.5 fs Pulses in the Deep Ultraviolet von Reislöhner, Jan, Leithold, Christoph, Pfeiffer, Adrian N

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Generation of 25-TW Femtosecond Laser Pulses at 515 nm with Extremely High Temporal Contrast von Hornung, Marco, Becker, Georg, Seidel, Andreas, Reislöhner, Jan, Liebetrau, Hartmut, Bock, Lennart, Keppler, Sebastian, Kessler, Alexander, Zepf, Matthew, Hein, Joachim, Kaluza, Malte

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MEASUREMENT APPARATUS, METHOD FOR OPERATING A MASK-METROLOGY MEASUREMENT APPARATUS, AND COMPUTER PROGRAM PRODUCT von Frank, Thomas, Reisloehner, Jan, Matejka, Ulrich

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MEASURING APPARATUS, METHOD FOR OPERATING MASK-METROLOGY MEASURING APPARATUS, AND COMPUTER PROGRAM PRODUCT von FRANK THOMAS, JAN REISLOEHNER, ULRICH MATEJKA

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MEASUREMENT APPARATUS METHOD FOR OPERATING A MASK-METROLOGY MEASUREMENT APPARATUS AND COMPUTER PROGRAM PRODUCT von FRANK THOMAS, REISLOEHNER JAN, MATEJKA ULRICH

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Messvorrichtung, Verfahren zum Betreiben einer maskenmetrologischen Messvorrichtung und Computerprogrammprodukt von Frank, Thomas, Reisloehner, Jan, Matejka, Ulrich

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MASK-METROLOGY MEASURING DEVICE AND METHOD FOR EXAMINING A PHOTOMASK von MATEJKA, Ulrich, DOERING, Dirk, FRANK, Thomas, GRAU, Dominik, WITTIG, Lars-Christian, SEMMLER, Ralph, THALER, Thomas, REISLOEHNER, Jan, DMITRIEV, Vladimir

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Maskenmetrologische Messvorrichtung und Verfahren zum Untersuchen einer Fotomaske von Doering, Dirk, Wittig, Lars-Christian, Thaler, Thomas, Frank, Thomas, Semmler, Ralph, Reisloehner, Jan, Dmitriev, Vladimir, Matejka, Ulrich, Grau, Dominik

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