Impact of interface variations on J-V and C-V polarity asymmetry of MIM capacitors with amorphous and crystalline Zr(1-x)AlxO2 films von WEINREICH, W, REICHE, R, SCHRODER, U, BAUER, A. J, RYSSEL, H, LEMBERGER, M, JEGERT, G, MÜLLER, J, WILDE, L, TEICHERT, S, HEITMANN, J, ERBEN, E, OBERBECK, L

Volltext

Future internet and the agri-food sector: State-of-the-art in literature and research von Lehmann, Richard J., Reiche, Robert, Schiefer, Gerhard

Volltext

Angle-resolved XPS: a critical evaluation for various applications von Oswald, S., Zier, M., Reiche, R., Wetzig, K.

Volltext

Interface formation and reactions at Ta–Si and Ta–SiO2 interfaces studied by XPS and ARXPS von Zier, M, Oswald, S, Reiche, R, Kozlowska, M, Wetzig, K

Volltext

Corrosion behaviour of Zr-based bulk glass-forming alloys containing Nb or Ti von Raju, V.R, Kühn, U, Wolff, U, Schneider, F, Eckert, J, Reiche, R, Gebert, A

Volltext

XPS investigations of thin tantalum films on a silicon surface von Zier, M, Oswald, S, Reiche, R, Wetzig, K

Volltext

Assessment of staffing and infrastructures of paediatric oncology and haematology centres in Germany von Herold, R, Reiche, R, Creutzig, U, Henze, G

Volltext

Quantitative ARXPS investigation of systems with ultrathin aluminium oxide layers von Kozłowska, M., Reiche, R., Oswald, S., Vinzelberg, H., Hübner, R., Wetzig, K.

Volltext

Structure, microstructure and electronic characterisation of the Al2O3/SiO2 interface by electron spectroscopies von Reiche, R., Yubero, F., Espinós, J.P., González-Elipe, A.R.

Volltext

XPS and factor analysis for investigation of sputter-cleaned surfaces of metal (Re, Ir, Cr)–silicon thin films von Reiche, R, Oswald, S, Wetzig, K

Volltext

Pyramid formation on a high index copper bicrystal during bombardment with 10 keV argon and krypton ions von Reiche, R, Hauffe, W

Volltext

XPS studies and factor analysis of PbS nanocrystal-doped SiO2 thin films von Reiche, R, Thielsch, R, Oswald, S, Wetzig, K

Volltext

First stages of growth of cerium oxide deposited on alumina and reduced titania surfaces von Mansilla, C., Yubero, F., Zier, M., Reiche, R., Oswald, S., Holgado, J. P., Espinós, J. P., González-Elipe, A. R.

Volltext

Void formation in the Cu layer during thermal treatment of SiNx/Cu/Ta73Si27/SiO2/Si systems von Hübner, R., Reiche, R., Hecker, M., Mattern, N., Hoffmann, V., Wetzig, K., Heuer, H., Wenzel, Ch, Engelmann, H.-J., Zschech, E.

Volltext

Benchmarking national surveillance systems: a new tool for the comparison of communicable disease surveillance and control in Europe von Reintjes, Ralf, Thelen, Martina, Reiche, Ralf, Csohán, Ágnes

Volltext

Influence of N 2 and NH 3 annealing on the nitrogen incorporationand k -value of thin ZrO 2 layers von Weinreich, W., Ignatova, V. A., Wilde, L., Teichert, S., Lemberger, M., Bauer, A. J., Reiche, R., Erben, E., Heitmann, J., Oberbeck, L., Schröder, U.

Volltext

Fate and effects of the insecticide Dursban 4E in indoor Elodea-dominated and macrophyte-free freshwater model ecosystems. II. Secondary effects on community structure von Brock, T.C.M. (DLO the Winand Staring Centre for Integrated Land, Soil, and Water Research, Wageningen, Netherlands), Bogaert, M. van den, Bos, A.R, Breukelen, S.W.F. van, Reiche, R, Terwoert, J, Suykerbuyk, R.E.M

Volltext

Impact of interface variations on @@iJ@-@@iV@ and @@iC@-@@iV@ polarity asymmetry of MIM capacitors with amorphous and crystalline Zr@@d(1-@@@i@@dx@@@@d)@Al@@i@@dx@@O@@d2@ films von Weinreich, W, Reiche, R, Lemberger, M, Jegert, G, Mueller, J, Wilde, L, Teichert, S, Heitmann, J, Erben, E, Oberbeck, L, Schroeder, U, Bauer, A J, Ryssel, H

Volltext

Analytical investigations of tunnel magnetoresistance layers von Thomas, Jürgen, Reiche, Rainer, Vinzelberg, Hartmut

Volltext

Impact of interface variations on J– V and C– V polarity asymmetry of MIM capacitors with amorphous and crystalline Zr (1− x )Al x O 2 films von Weinreich, W., Reiche, R., Lemberger, M., Jegert, G., Müller, J., Wilde, L., Teichert, S., Heitmann, J., Erben, E., Oberbeck, L., Schröder, U., Bauer, A.J., Ryssel, H.

Volltext