V/Q SPECT imaging of acute pulmonary embolus — A practical perspective von Laurence, I.J, Redman, S.L, Corrigan, A.J.G, Graham, R.N.J

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Ultrasound findings of masses of the paratesticular space von Smart, J.M, Jackson, E.K, Redman, S.L, Rutherford, E.E, Dewbury, K.C

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Fluorine-18 labelled prostate-specific membrane antigen (PSMA)-1007 positron-emission tomography–computed tomography: normal patterns, pearls, and pitfalls von Foley, R.W., Redman, S.L., Graham, R.N., Loughborough, W.W., Little, D.

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Influence of Growth Phase on Bacterial Deposition:  Interaction Mechanisms in Packed-Bed Column and Radial Stagnation Point Flow Systems von Walker, Sharon L, Redman, Jeremy A, Elimelech, Menachem

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Self-heating effects in SOI MOSFETs and their measurement by small signal conductance techniques von Tenbroek, B.M., Lee, M.S.L., Redman-White, W., Bunyan, J.T., Uren, M.J.

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Impact of self-heating and thermal coupling on analog circuits in SOI CMOS von Tenbroek, B.M., Lee, M.S.L., Redman-White, W., Bunyan, R.J.T., Uren, M.J.

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A physically based compact model of partially depleted SOI MOSFETs for analog circuit simulation von Lee, M.S.L., Tenbroek, B.M., Redman-White, W., Benson, J., Uren, M.J.

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A multibit ΣΔ modulator in floating-body SOS/SOI CMOS for extreme radiation environments von Edwards, C.F., Redman-White, W., Bracey, M., Tenbroek, B.M., Lee, M.S.L., Uren, M.J.

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Measurement of buried oxide thermal conductivity for accurate electrothermal simulation of SOI devices von Tenbroek, Bernard M, Bunyan, R John T, Whiting, Gary, Redman-White, William, Uren, Michael J, Brunson, Kevin M, Lee, Michael S L, Edwards, Christopher F

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Characterization of layout dependent thermal coupling in SOI CMOS current mirrors von Tenbroek, B.M., Redman-White, W., Lee, M.S.L., Bunyan, R.J.T., Uren, M.J., Brunson, K.M.

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Analogue design issues for low-power SOI CMOS von Redman-White, W, Tenbroek, BM, Lee, MSL, Edwards, CF, Uren, MJ, Bunyan, RJT

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The JCMT Plane Survey: early results from the ℓ = 30° field von Moore, T.J.T., Plume, R., Thompson, M.A., Parsons, H., Urquhart, J.S., Eden, D.J., Dempsey, J.T., Morgan, L.K., Thomas, H.S., Buckle, J., Brunt, C.M., Butner, H., Carretero, D., Chrysostomou, A., deVilliers, H.M., Fich, M., Hoare, M.G., Manser, G., Mottram, J.C., Natario, C., Olguin, F., Peretto, N., Polychroni, D., Redman, R.O., Rigby, A.J., Salji, C., Summers, L.J., Berry, D., Currie, M.J., Jenness, T., Pestalozzi, M, Traficante, A., Bastien, P., diFrancesco, J., Davis, C.J., Evans, A., Friberg, P., Fuller, G.A., Gibb, A.G., Gibson, S., Hill, T., Johnstone, D., Joncas, G., Longmore, S.N., Lumsden, S.L., Martin, P.G., Lu'o'ng, Q.N., Pineda, J.E., Purcell, C., Richer, J.S., Schieven, G.H., Shipman, R., Spaans, M., Taylor, A.R., Viti, S., Weferling, B., White, G.J., Zhu, M.

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DETECTING FETAL CELLS IN MATERNAL CIRCULATION von Yeoh, S.C., Sargent, I.L., Redman, C.W.G., Thein, S.L.

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Electrical measurement of silicon film and oxide thicknesses in partially depleted SOI technologies von Tenbroek, B.M., Redman-White, W., Lee, M.S.L., Uren, M.J.

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Experimental Validation of Simple Electro-Thermal Circuit Models for SOI MOSFETs by Direct DC-UHF Measurement of Drain Admittance von Tenbroek, B M, Redman-White, W, Lee, M S L, Uren, M J

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Identification of thermal and electrical time constants in SOIMOSFETS from small signal measurements von Tenbroek, B. M., Redman-White, W., Uren, M. J., Lee, M. S. L., Ward, M. C. L.

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