Defect-oriented cell-internal testing von Hapke, F, Redemund, W, Schloeffel, J, Krenz-Baath, R, Glowatz, A, Wittke, M, Hashempour, H, Eichenberger, S

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Cell-aware analysis for small-delay effects and production test results from different fault models von Hapke, F., Schloeffel, J., Redemund, W., Glowatz, A., Rajski, J., Reese, M., Rearick, J., Rivers, J.

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Cell-aware Production test results from a 32-nm notebook processor von Hapke, F., Reese, M., Rivers, J., Over, A., Ravikumar, V., Redemund, W., Glowatz, A., Schloeffel, J., Rajski, J.

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