Device design guidelines for nano-scale MuGFETs von Lee, Chi-Woo, Yun, Se-Re-Na, Yu, Chong-Gun, Park, Jong-Tae, Colinge, Jean-Pierre

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New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors von Lee, In Kyung, Na Yun, Se Re, Kim, Kyo Sun, Yu, Chong Gun, Park, Jong Tae

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Quantum-mechanical effects in nanometer scale MuGFETs von Yun, Se Re Na, Yu, Chong Gun, Park, Jong Tae, Colinge, Jean Pierre

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A Quantum Definition of Threshold Voltage in MuGFETs von Se Re Na Yun, Chong Gun Yu, Jong Tae Park, Chi-Woo Lee, Lederer, D., Afzalian, A., Ran Yan, Colinge, J.P.

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Hot electron induced punchthrough voltage of p-channel SOI MOSFET’s at room and elevated temperatures von Re Na Yun, Se, Sub Park, Won, Ha Lee, Byung, Tae Park, Jong

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Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET’s von SE RE NA YUN, CHONG GUN YU, SEOK HEE JEON, CHUNG KYUE KIM, JONG TAE PARK, COLINGE, Jean Pierre

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Comprehensive transcriptome profiling between balding and non-balding scalp of female pattern hair loss in Asian von Kim, Soon Re, Kim, Yun Ji, Kim, Ju-Hee, Kim, Su Na, Park, Won Serk, Kim, Se Hwan, Chung, Juhyun, Choi, Mi soo, Kim, MyungHwa, Park, Byung Cheol

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