The coventry thermal injury study von Matthews, R.N., Rauf, K.G., Warren, J.

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Cover of pre-sternal defects von Rauf, K G, Matthews, R N

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Molecular-dynamics model of energetic fluorocarbon-ion bombardment on SiO{sub 2}. II. CF{sub x}{sup +} (x=1, 2, 3) ion etch characterization von Smirnov, V.V., Stengach, A.V., Gaynullin, K.G., Pavlovsky, V.A., Rauf, S., Stout, P., Ventzek, P.L.G., Advanced Products Research and Development Laboratory, Freescale Semiconductor, Inc., 3501 Ed Bluestein Boulevard, MD K-10, Austin, Texas 78721

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Molecular-dynamics model of energetic fluorocarbon-ion bombardment on SiO{sub 2} I. Basic model and CF{sub 2}{sup +}-ion etch characterization von Smirnov, V.V., Stengach, A.V., Gaynullin, K.G., Pavlovsky, V.A., Rauf, S., Stout, P.J., Ventzek, P.L.G., Advanced Products Research and Development Laboratory, Freescale Semiconductor, Inc., 3501 Ed Bluestein Boulevard, MD K-10, Austin, Texas 78721

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Inversion and prochirality in bis-thio-and-selenoether complexes of trimethylplatinum(IV) halides von Abel, E.W., Rauf Khan, A., Kite, K., Orrel, K.G., Sˇik, V.

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