Thermodesorption Spectrometer of Hard-Volatile Active Organic Compounds von Iskhakova, S. S., Khasanov, U., Rasulev, U. Kh, Usmanov, D. T.

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On the Sputtering of Copper Phthalocyanine Molecules on a GaAs Substrate under Bombardment with Multiply Charged Ions von Akhunov, Sh. Dj, Rasulev, U. Kh, Usmanov, D. T.

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Indium sputtering upon bombardment with cluster ions von Morozov, S. N., Rasulev, U. Kh

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Surface-ionization methods and devices of indication and identification of nitrogen-containing base molecules von Rasulev, U.Kh, Khasanov, U, Palitcin, V.V

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Surface Ionization Ion Mobility Spectrometry von Wu, Ching, Hill, Herbert H, Rasulev, U. Kh, Nazarov, E. G

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Secondary ion emission from a GaAs single crystal upon bombardment with Bi^sub m^^sup +^ cluster ions von Morozov, S N, Rasulev, U Kh

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Secondary ion emission from a GaAs single crystal upon bombardment with Bi m + cluster ions von Morozov, S. N., Rasulev, U. Kh

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Secondary ion emission from a GaAs single crystal upon bombardment with Bim+ cluster ions von Morozov, S. N., Rasulev, U. Kh

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A surface-ionization method of detection of a neutral component of indium sputtering under bombardment by cluster ions von Morozov, S. N., Rasulev, U. Kh

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SIMS of silicon bombarded with Sb m + cluster ions von Morozov, S. N., Rasulev, U. Kh

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SIMS of silicon bombarded with Sb^sub m^^sup +^ cluster ions von Morozov, S N, Rasulev, U Kh

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SIMS of silicon bombarded with Sbm+ cluster ions von Morozov, S. N., Rasulev, U. Kh

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Application of the surface ionization for the detection of secondary particles in the secondary-ion mass spectrometry (SIMS) von Morozov, S. N., Rasulev, U. Kh

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Comparative study of polyatomic secondary ion emission from silicon with Aum-, Sim- and Cm- projectiles von Morozov, S.N., Rasulev, U.Kh

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Emission of quasi-thermal ions from a solid bombarded by cluster ions von Morozov, S. N., Rasulev, U. Kh

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Non-additive effects in secondary-ion emission from V, Nb and Ta under gold-cluster bombardment von Morozov, S.N., Rasulev, U.Kh

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Sputtering source of cluster ions and surface-ionization source of polyatomic ions of organic compounds von Rasulev, U.Kh, Morozov, S.N., Khasanov, U., Usmanov, D.T.

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Secondary ion emission from bismuth under bombardment with Bi^sub m^^sup -^ and Au^sub m^^sup -^ cluster ions von Morozov, S N, Rasulev, U Kh

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Secondary ion emission from bismuth under bombardment with Bi m − and Au m − cluster ions von Morozov, S. N., Rasulev, U. Kh

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Application of surface ionization to determine rate constant and activation energy of dissociation reactions of nitrogen base polyatomic molecules on W oxides von Rakhmanov, G., Rasulev, U. Kh, Saidumarov, I.

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