Scientific-educational centres 'Embedded systems of automation and computer engineering' as the basis of training of domestic specialists in the field of microprocessor technologie... von Cabezas, Diego, Raskin, Denis, Vassiliev, Alexei, Kulyashova, Zinaida, Kurniawan, Yohannes

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Rapid prototyping of distributed embedded systems as a part of Internet of Things von Raskin, Denis, Vassiliev, Alexei, Samarin, Vasili, Cabezas, Diego, Hiererra, Siti Elda, Kurniawan, Yohannes

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Autoradiographic Assessment of Blood Flow Heterogeneity in the Hamster Heart von Stapleton, Dwight D., Moffett, Tyler C., Raskin, Denis G., Bassingthwaighte, James R.

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Detection mechanism in highly sensitive ZnO nanowires network gas sensors von Caicedo, Nohora, Leturcq, Renaud, Raskin, Jean-Pierre, Flandre, Denis, Lenoble, Damien

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Indirect light absorption model for highly strained silicon infrared sensors von Roisin, Nicolas, Brunin, Guillaume, Rignanese, Gian-Marco, Flandre, Denis, Raskin, Jean-Pierre

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Analysis of trap distribution and NBTI degradation in Al2O3/SiO2 dielectric stack von Yan, Yiyi, Kilchytska, Valeriya, Flandre, Denis, Raskin, Jean-Pierre

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Analog/RF performance of multiple gate SOI devices: wideband simulations and characterization von Raskin, J.-P., Tsung Ming Chung, Kilchytska, V., Lederer, D., Flandre, D.

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Asgard/NOTT: L -band nulling interferometry at the VLTI: I. Simulating the expected high-contrast performance von Laugier, Romain, Defrère, Denis, Woillez, Julien, Courtney-Barrer, Benjamin, Dannert, Felix A., Matter, Alexis, Dandumont, Colin, Gross, Simon, Absil, Olivier, Bigioli, Azzurra, Garreau, Germain, Labadie, Lucas, Loicq, Jérôme, Martinod, Marc-Antoine, Mazzoli, Alexandra, Raskin, Gert, Sanny, Ahmed

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Characterization of thin Al2O3/SiO2 dielectric stack for CMOS transistors von Yan, Yiyi, Kilchytska, Valeriya, Wang, Bin, Faniel, Sébastien, Zeng, Yun, Raskin, Jean-Pierre, Flandre, Denis

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Improved Split CV Mobility Extraction in 28 nm Fully Depleted Silicon on Insulator Transistors von Morelle, Alban, Vandermolen, Eric, Kilchytska, Valeriya, Raskin, Jean-Pierre, Flandre, Denis

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Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks using conductance method von Yan, Yiyi, Kilchytska, Valeriya, Flandre, Denis, Raskin, Jean-Pierre

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Low-power silicon strain sensor based on CMOS current reference topology von Roisin, Nicolas, Delhaye, Thibault P., André, Nicolas, Raskin, Jean-Pierre, Flandre, Denis

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Raman strain–shift measurements and prediction from first-principles in highly strained silicon von Roisin, Nicolas, Colla, Marie-Stéphane, Raskin, Jean-Pierre, Flandre, Denis

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Impact of thermal coupling effects on the digital and analog figures of merit of UTBB SOI MOSFET pairs von Vanbrabant, Martin, Raskin, Jean-Pierre, Flandre, Denis, Kilchytska, Valeriya

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Variation Range of Different Inductor Topologies with Shields for RF and Inductive Sensing Applications von Tounsi, Fares, Said, Mohamed Hadj, Hauwaert, Margo, Kaziz, Sinda, Francis, Laurent A, Raskin, Jean-Pierre, Flandre, Denis

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Experimental study of thermal coupling effects in FD-SOI MOSFET von Vanbrabant, Martin, Raskin, Jean-Pierre, Flandre, Denis, Kilchytska, Valeriya

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Band gap reduction in highly-strained silicon beams predicted by first-principles theory and validated using photoluminescence spectroscopy von Roisin, Nicolas, Colla, Marie-Stéphane, Scaffidi, Romain, Pardoen, Thomas, Flandre, Denis, Raskin, Jean-Pierre

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28-nm FD-SOI CMOS RF Figures of Merit Down to 4.2 K von Nyssens, Lucas, Halder, Arka, Esfeh, Babak Kazemi, Planes, Nicolas, Flandre, Denis, Kilchytska, Valeriya, Raskin, Jean-Pierre

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A Physical Model of Contact Resistance in Ti-Contacted Graphene-Based Field Effect Transistors von Wang, Bin, Malik, Mohammad Wasil, Yan, Yiyi, Kilchytska, Valeriya, Zeng, Yun, Flandre, Denis, Raskin, Jean-Pierre

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Enhanced ultraviolet photoresponse in a graphene-gated ultra-thin Si-based photodiode von Li, Guoli, André, Nicolas, Huet, Benjamin, Delhaye, Thibault, Reckinger, Nicolas, Francis, Laurent A, Liao, Lei, Raskin, Jean-Pierre, Zeng, Yun, Flandre, Denis

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