Precise control of thermal conductivity at the nanoscale through individual phonon-scattering barriers von Rastelli, A, Dilhaire, S, Mingo, N, Pernot, G, Stoffel, M, Savic, I, Pezzoli, F, Chen, P, Savelli, G, Jacquot, A, Schumann, J, Denker, U, Mönch, I, Deneke, Ch, Schmidt, O. G, Rampnoux, J. M, Wang, S, Plissonnier, M

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All-optical broadband ultrasonography of single cells von Dehoux, T., Ghanem, M. Abi, Zouani, O. F., Rampnoux, J.-M., Guillet, Y., Dilhaire, S., Durrieu, M.-C., Audoin, B.

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Fabrication of Bi2Te3 nanowire arrays and thermal conductivity measurement by 3ω-scanning thermal microscopy von Munoz Rojo, M, Grauby, S, Rampnoux, J-M, Caballero-Calero, O, Martin-Gonzalez, M, Dilhaire, S

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Picosecond time resolved opto-acoustic imaging with 48 MHz frequency resolution von Abbas, A, Guillet, Y, Rampnoux, J-M, Rigail, P, Mottay, E, Audoin, B, Dilhaire, S

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Generation and detection of shear acoustic waves in metal submicrometric films with ultrashort laser pulses von ROSSIGNOL, C, RAMPNOUX, J. M, PERTON, M, AUDOIN, B, DILHAIRE, S

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Anomalous light absorption around subwavelength apertures in metal films von Lozan, O, Perrin, M, Ea-Kim, B, Rampnoux, J M, Dilhaire, S, Lalanne, P

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Heterodyne picosecond thermoreflectance applied to nanoscale thermal metrology von Dilhaire, S., Pernot, G., Calbris, G., Rampnoux, J. M., Grauby, S.

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Time gating imaging through thick silicon substrate: a new step towards backside characterisation von Rampnoux, J.M., Michel, H., Salhi, M.A., Grauby, S., Claeys, W., Dilhaire, S.

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Study of thermomechanical properties of Si∕SiGe superlattices using femtosecond transient thermoreflectance technique von Ezzahri, Y., Dilhaire, S., Grauby, S., Rampnoux, J. M., Claeys, W., Zhang, Y., Zeng, G., Shakouri, A.

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The evolution of Sumba Island (Indonesia) revisited in the light of new data on the geochronology and geochemistry of the magmatic rocks von Abdullah, C.I, Rampnoux, J.-P, Bellon, H, Maury, R.C, Soeria-Atmadja, R

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Coherent phonons in Si/ SiGe superlattices von Ezzahri, Younès, Grauby, Stéphane, Rampnoux, Jean-Michel, Michel, Hélène, Pernot, Gilles, Claeys, W., Dilhaire, Stefan, Rossignol, Clément, Zeng, G., Shakouri, Ali

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Influence of generated defects by Ar-implantation on the thermoelectric properties of ScN von Burcea, R, J -F Barbot, P -O Renault, Eyidi, D, Girardeau, T, Marteau, M, Giovannelli, F, Zenji, A, J-M Rampnoux, Dilhaire, S, Eklund, P, A Le Febvrier

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Cross-plan Si∕SiGe superlattice acoustic and thermal properties measurement by picosecond ultrasonics von Ezzahri, Y., Grauby, S., Dilhaire, S., Rampnoux, J. M., Claeys, W.

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Applications of temperature phase measurements to IC testing von Altet, J., Rampnoux, J.M., Batsale, J.C., Dilhaire, S., Rubio, A., Claeys, W., Grauby, S.

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Effect of the laser pulse duration on picosecond ultrasonic signals von Rossignol, C., Audoin, Bertrand, Rampnoux, Jean-Michel, Dilhaire, S., Claeys, W.

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Laser scanning thermomechanical imaging of microelectronic devices von Grauby, S., Salhi, A., Rampnoux, J.-M., Claeys, W., Dilhaire, S.

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Picosecond ultrasonics time resolved spectroscopy usinga photonic crystal fiber von Rossignol, C., Rampnoux, J. M., Dehoux, T., Dilhaire, S., Audoin, B.

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Study of thermomechanical properties of Si ∕ Si Ge superlattices using femtosecond transient thermoreflectance technique von Ezzahri, Y., Dilhaire, S., Grauby, S., Rampnoux, J. M., Claeys, W., Zhang, Y., Zeng, G., Shakouri, A.

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Joule expansion imaging techniques on microlectronic devices von Grauby, S., Lopez, L.-D.P., Salhi, A., Puyoo, E., Rampnoux, J.-M., Claeys, W., Dilhaire, S.

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Mise en évidence du Crétacé supérieur dans la couverture septentrionale de Dora Maira, région de Suse, Italie (Alpes occidentales). Conséquences paléogéographiques et structurales... von MARTHALER, M, FUDRAL, S, DEVILLE, E, RAMPNOUX, J.-P

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