Effect of bilayer period on properties of Cr/CrN multilayer coatings produced by laser ablation von Kot, M., Rakowski, W.A., Major, Ł., Major, R., Morgiel, J.

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Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC von Pleskacz, W.A., Jenihhin, M., Raik, J., Rakowski, M., Ubar, R., Kuzmicz, W.

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The Influence of Defect Distribution Function Parameters on Test Patterns Generation von Rakowski, M., Pleskacz, W.A., Borkowski, P.

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Layout to Logic Defect Analysis for Hierarchical Test Generation von Jenihhin, M., Raik, J., Ubar, R., Pleskacz, W.A., Rakowski, M.

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