The current epidemiological and epizootological situation of ixodic tick-borne borreliosis in the Samara region von Kulagina, A.P., Chekanova, T.A., Vandysheva, T.V., Titkov, A.V., Rakov, A.V., Suzdaltsev, A.A.

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Interaction of Salmonella enteritidis and Salmonella typhimurium in Microbial Association Formed by Them in In Vitro Experiment von Rakov, A. V., Yakovlev, A. A., Kuznetsova, N. A.

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A Study of Parameters of the Counterpropagating Leader and its Influence on the Lightning Protection of Objects Using Large-Scale Laboratory Modeling von Syssoev, V. S., Kostinskiy, A. Yu, Makalskiy, L. M., Rakov, A. V., Andreev, M. G., Bulatov, M. U., Sukharevsky, D. I., Naumova, M. U.

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Standard sample for calibration of transmission electron microscopes von Bodunov, D.S, Gavrilenko, V.P, Zablotskii, A.V, Kuzin, A.A, Kuzin, A. Yu, Mityukhlyaev, V.B, Rakov, A.V, Todua, P.A, Filippov, M.N

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Distortion of the Profile of Surface Relief Elements of Single-Crystal Silicon Caused by Contamination in a Low-Voltage Scanning Electron Microscope von Gavrilenko, V. P., Kuzin, A. Yu, Mityukhlyaev, V. B., Rakov, A. V., Todua, P. A., Filippov, M. N., Sharonov, V. A.

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Measurement of the thickness of natural oxide on a silicon relief step structure von Gavrilenko, V. P., Zablotskii, A. V., Kuzin, A. A., Kuzin, A. Yu, Kuz’min, A. A., Ermakova, M. A., Mityukhlyaev, V. B., Rakov, A. V., Todua, P. A., Filippov, M. N.

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Influence of contamination in scanning electron microscopes on the profile of relief elements in monocrystalline silicon von Gavrilenko, V. P., Kuzin, A. Yu, Mityukhlyaev, V. B., Rakov, A. V., Todua, P. A., Filippov, M. N., Sharonov, V. A.

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Scan nonlinearity of a scanning electron microscope von Alzoba, V. V., Gavrilenko, V. P., Kuzin, A. Yu, Mityukhlyaev, V. B., Rakov, A. V., Todua, P. A., Filippov, M. N.

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Selection of optimal parameters of the electronic probe of a scanning electron microscope in measurement of the geometric parameters of objects by means of a defocusing probe von Alzoba, V. V., Kuzin, A. Yu, Larionov, Yu. V., Rakov, A. V., Todua, P. A., Filippov, M. N.

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Measurement of the linear dimensions of nanorelief elements with a trapezoidal profile by defocusing the electron beam of a scanning electron microscope von Gavrilenko, V. P., Kuzin, A. Yu, Larionov, Yu. V., Mityukhlyaev, V. B., Rakov, A. V., Todua, P. A., Filippov, M. N.

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Defining the parameters of a cantilever tip AFM by reference structure von Bykov, V.A., Novikov, Yu.A., Rakov, A.V., Shikin, S.M.

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In memory of Kamil' Akhmetovich Valiev von Betelin, V.B., Velikhov, E.P., Gulyaev, Yurii V., Kokin, A.A., Kopaev, Yurii V., Krasnikov, G.Ya, Kuznetsov, F.A., Lukichev, V.F., Neizvestnyi, I.G., Orlikovsky, A.A., Rakov, A.V., Chaplygin, Yu.A.

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Electric Field Effects in Positron Diffusion and Annihilation in the Laminar Substances von Rakov, A.V., Shantarovich, Victor P., Novikov, Yu.A.

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Positron Annihilation Study of Metallic and Semiconductor Films von Rakov, A.V., Shantarovich, Victor P., Novikov, Yu.A., Goldanskii, V.I.

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Scanning electron microscope calibration with input data checking von Novikov, Yu. A., Rakov, A. V., Stekolin, I. Yu

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Measuring the diameter of an electron probe with a scanning electron microscope von Novikov, Yu. A., Rakov, A. V., Stekolin, I. Yu

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Measurement of linear dimensions of submicron structures with a scanning electron microscope von Danilov, V. A., Novikov, Yu. A., Rakov, A. V., Stekolin, I. Yu

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Calibration of scanning electron microscopes by means of pitch structures von Novikov, Yu. A., Rakov, A. V., Stekolin, I. Yu

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TEST OBJECT FOR CALIBRATING ELECTRON-SCAN MICROSCOPES von PLOTNIKOV JU.I, NOVIKOV JU.A, OZERIN JU.V, PROKHOROV A.M, RAKOV A.V, GORNEV E.S, VOLK CH.P

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Advanced morphological approach for systems value engineering von Rakov, D.

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