Embedded deterministic test von Rajski, J., Tyszer, J., Kassab, M., Mukherjee, N.

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Low-Power Scan Operation in Test Compression Environment von Czysz, D., Kassab, M., Xijiang Lin, Mrugalski, G., Rajski, J., Tyszer, J.

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Ring generators - new devices for embedded test applications von Mrugalski, G., Rajski, J., Tyszer, J.

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Low-Power Test Data Application in EDT Environment Through Decompressor Freeze von Czysz, D., Mrugalski, G., Rajski, J., Tyszer, J.

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Diagnosis of scan cells in BIST environment von Rajski, J., Tyszer, J.

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Timing-Aware Multiple-Delay-Fault Diagnosis von Mehta, V.J., Marek-Sadowska, M., Kun-Han Tsai, Rajski, J.

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Automated synthesis of phase shifters for built-in self-test applications von Rajski, J., Tamarapalli, N., Tyszer, J.

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Analysis and methodology for multiple-fault diagnosis von Zhiyuan Wang, Marek-Sadowska, M., Tsai, K.-H., Rajski, J.

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X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector von Rajski, J., Tyszer, J., Mrugalski, G., Wu-Tung Cheng, Mukherjee, N., Kassab, M.

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Fault Diagnosis With Convolutional Compactors von Mrugalski, G., Pogiel, A., Rajski, J., Tyszer, J.

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Embedded deterministic test for low cost manufacturing test von Rajski, J., Tyszer, J., Kassab, M., Mukherjee, N., Thompson, R., Kun-Han Tsai, Hertwig, A., Tamarapalli, N., Mrugalski, G., Eide, G., Jun Qian

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Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers von Hellebrand, S., Rajski, J., Tarnick, S., Venkataraman, S., Courtois, B.

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Low Power Scan Shift and Capture in the EDT Environment von Czysz, D., Kassab, M., Lin, X., Mrugalski, G., Rajski, J., Tyszer, J.

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Test data decompression for multiple scan designs with boundary scan von Rajski, J., Tyszer, J., Zacharia, N.

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Delay-fault diagnosis using timing information von Zhiyuan Wang, Marek-Sadowska, M.M., Tsai, K.-H., Rajski, J.

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Improving the Resolution of Single-Delay-Fault Diagnosis von Mehta, V.J., Marek-Sadowska, M., Kun-Han Tsai, Rajski, J.

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High performance dense ring generators von Mrugalski, G., Mukherjee, M., Rajski, J., Tyszer, J.

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Cell-aware analysis for small-delay effects and production test results from different fault models von Hapke, F., Schloeffel, J., Redemund, W., Glowatz, A., Rajski, J., Reese, M., Rearick, J., Rivers, J.

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Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs von Remersaro, S., Lin, X., Zhang, Z., Reddy, S.M., Pomeranz, I., Rajski, J.

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Finite memory test response compactors for embedded test applications von Rajski, J., Tyszer, J., Chen Wang, Reddy, S.M.

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