The structural aspects of non-crystalline SiO2 films on silicon: a review von REVESZ, A. G, HUGHES, H. L

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Nuclear reaction analysis of hydrogen in the buried SiO2 layer of Si/SiO2/Si structures von KRAUSER, J, REVESZ, A. G, HUGHES, H. L

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Structural rearrangement of SiO2 films during their growth and annealing von REVESZ, A. G

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Effects of heat treatments in inert ambients on Si/SiO2 structures von REVESZ, A. G, HUGHES, H. L

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Photoluminescence spectra of SIMOX buried oxide layers prepared under various conditions von Rebohle, L., Revesz, A.G., Skorupa, W., Hughes, H.L.

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Hydrogen in buried SiO2 layers von REVESZ, A. G, STAHLBUSH, R. E, HUGHES, H. L

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Confinement phenomena in buried oxides of SIMOX structures as affected by processing von AFANAS'EV, V. V, REVESZ, A. G, HUGHES, H. L

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Electron spin resonance of defects in silicon-on-insulator structures formed by oxygen implantation : influence of γ irradiation von STESMANS, A, REVESZ, A. G, HUGHES, H. L

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Bulk electrical conduction in the buried oxide of SIMOX structures von REVESZ, A. G, BROWN, G. A, HUGHES, H. L

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Irradiation-induced ESR active defects in SIMOX structures von Stesman, A., Devine, R., Revesz, A.G., Hughes, H.

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Deuterium interactions with ion-implanted SiO2 layers in silicon von MYERS, S. M, BROWN, G. A, REVESZ, A. G, HUGHES, H. L

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Trap generation in buried oxides of silicon-on-insulator structures by vacuum ultraviolet radiation von AFANAS'EV, V. V, STESMANS, A, REVESZ, A. G, HUGHES, H. L

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Structural and strain-related effects during growth of SiO2 films on silicon von MRSTIK, B. J, REVESZ, A. G, ANCONA, M, HUGHES, H. L

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Oxygen vacancies in SiO2 layers on Si produced at high temperature von AFANAS'EV, V. V, STESMANS, A, REVESZ, A. G, HUGHES, H. L

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Defect electrical conduction in SIMOX buried oxides von Brown, G.A., Revesz, A.G.

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Conducting and charge-trapping defects in buried oxide layers of SIMOX structures von AFANAS'EV, V. V, BROWN, G. A, HUGHES, H. L, LIU, S. T, REVESZ, A. G

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Density gradient in SiO2 films on silicon as revealed by positron annihilation spectroscopy von REVESZ, A. G, ANWAND, W, BRAUER, G, HUGHES, H. L, SKORUPA, W

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Chemical and Structural Aspects of the Irradiation Behavior of SiO2 Films on Silicon von Revesz, A. G.

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Structural interpretations for some Raman lines from vitreous silica von Revesz, A.G., Walrafen, G.E.

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Structure of SiO2 films on silicon as revealed by oxygen transport von REVESZ, A. G, MRSTIK, B. J, HUGHES, H. L, MCCARTHY, D

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