Phase Change Memory von Wong, H.-S. Philip, Raoux, Simone, Kim, SangBum, Liang, Jiale, Reifenberg, John P., Rajendran, Bipin, Asheghi, Mehdi, Goodson, Kenneth E.

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The Impact of Thermal Boundary Resistance in Phase-Change Memory Devices von Reifenberg, J.P., Kencke, D.L., Goodson, K.E.

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Thermal Boundary Resistance Measurements for Phase-Change Memory Devices von Reifenberg, J.P., Kuo-Wei Chang, Panzer, M.A., Sangbum Kim, Rowlette, J.A., Asheghi, M., Wong, H.-S.P., Goodson, K.E.

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Resistance and Threshold Switching Voltage Drift Behavior in Phase-Change Memory and Their Temperature Dependence at Microsecond Time Scales Studied Using a Micro-Thermal Stage von SangBum Kim, Byoungil Lee, Asheghi, Mehdi, Hurkx, Fred, Reifenberg, John P, Goodson, Kenneth E, Wong, H.-S Philip

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Thermal conductivity anisotropy and grain structure in Ge2Sb2Te5 films von Lee, Jaeho, Li, Zijian, Reifenberg, John P., Lee, Sangchul, Sinclair, Robert, Asheghi, Mehdi, Goodson, Kenneth E.

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Temperature-Dependent Thermal Properties of Phase-Change Memory Electrode Materials von Bozorg-Grayeli, E., Reifenberg, J. P., Panzer, M. A., Rowlette, J. A., Goodson, K. E.

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Grain Boundaries, Phase Impurities, and Anisotropic Thermal Conduction in Phase-Change Memory von Zijian Li, Jaeho Lee, Reifenberg, J. P., Asheghi, M., Jeyasingh, R. G. D., Wong, H. P., Goodson, K. E.

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Thickness and stoichiometry dependence of the thermal conductivity of GeSbTe films von Reifenberg, John P., Panzer, Matthew A., Kim, SangBum, Gibby, Aaron M., Zhang, Yuan, Wong, Simon, Wong, H.-S. Philip, Pop, Eric, Goodson, Kenneth E.

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Thermal disturbance and its impact on reliability of phase-change memory studied by the micro-thermal stage von SangBum Kim, Byoungil Lee, Asheghi, M, Hurkx, G A M, Reifenberg, J, Goodson, K, Wong, H P

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Thermal conductivity anisotropy and grain structure in Ge 2 Sb 2 Te 5 films von Lee, Jaeho, Li, Zijian, Reifenberg, John P., Lee, Sangchul, Sinclair, Robert, Asheghi, Mehdi, Goodson, Kenneth E.

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Phase Change Memory: NANOELECTRONICS RESEARCH FOR BEYOND CMOS INFORMATION PROCESSING von WONG, H.-S. Philip, RAOUX, Simone, KIM, Sangbum, JIALE LIANG, REIFENBERG, John P, RAJENDRAN, Bipin, ASHEGHI, Mehdi, GOODSON, Kenneth E

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COMPOSITIONALLY GRADED BUFFER FOR THERMO-PHOTOVOLTAIC SYSTEMS von REIFENBERG, John, STEWART, Jon, WELCH, Adam

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COMPOSITIONALLY GRADED BUFFER FOR THERMO-PHOTOVOLTAIC SYSTEMS von REIFENBERG, John, STEWART, Jon, WELCH, Adam

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BANDPASS ASSEMBLY FOR THERMO-PHOTOVOLTAIC DEVICES von STEWART, Jon, REIFENBERG, John, BAIRD, Kegan

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Thickness and stoichiometry dependence of the thermal conductivityof GeSbTe films von Reifenberg, John P., Panzer, Matthew A., Kim, SangBum, Gibby, Aaron M., Zhang, Yuan, Wong, Simon, Wong, H.-S. Philip, Pop, Eric, Goodson, Kenneth E.

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ELECTRODE STRUCTURE FOR MAGNESIUM SILICIDE-BASED BULK MATERIALS TO PREVENT ELEMENTAL MIGRATION FOR LONG TERM RELIABILITY von MILLER, Lindsay, REIFENBERG, John

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Decoupled thermal resistances of phase change material and their impact on PCM devices von Jaeho Lee, Reifenberg, John P, Bozorg-Grayeli, Elah, Hom, Lewis, Zijian Li, SangBum Kim, Asheghi, Mehdi, Wong, H.-S Philip, Goodson, Kenneth E

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The Role of Interfaces in Damascene Phase-Change Memory von Kencke, D.L., Karpov, I.V., Johnson, B.G., Sean Jong Lee, DerChang Kau, Hudgens, S.J., Reifenberg, J.P., Savransky, S.D., Jingyan Zhang, Giles, M.D., Spadini, G.

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COMPACT ENERGY CONVERSION SYSTEM von JONES, Karl, MEIKLE, John, NEITZEL, Kevin, REIFENBERG, John, EIGENFELD, Nathan

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COMPACT ENERGY CONVERSION DEVICE von JONES, Karl, MEIKLE, John, NEITZEL, Kevin, REIFENBERG, John, EIGENFELD, Nathan

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