Single-shot x-ray phase-contrast and dark-field imaging based on coded binary phase mask von Qiao, Zhi, Shi, Xianbo, Wojcik, Michael J., Rebuffi, Luca, Assoufid, Lahsen

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Development of x-ray beam wavefront sensors for Advanced Photon Source upgrade von Frith, Matthew G., Highland, Matthew J., Qiao, Zhi, Rebuffi, Luca, Assoufid, Lahsen, Shi, Xianbo

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ShadowOui: a new visual environment for X-ray optics and synchrotron beamline simulations von Rebuffi, Luca, Sánchez del Río, Manuel

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Mechanochemical Synthesis of Sustainable Ternary and Quaternary Nanostructured Cu2SnS3, Cu2ZnSnS4, and Cu2ZnSnSe4 Chalcogenides for Thermoelectric Applications von Nautiyal, Himanshu, Lohani, Ketan, Mukherjee, Binayak, Isotta, Eleonora, Malagutti, Marcelo Augusto, Ataollahi, Narges, Pallecchi, Ilaria, Putti, Marina, Misture, Scott T., Rebuffi, Luca, Scardi, Paolo

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Stochastic cooling of electrons and positrons with EUV light von Zholents, Alexander, Rebuffi, Luca, Shi, Xianbo

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Stoichiometry effect on Cu2ZnSnS4 thin films morphological and optical properties von Malerba, Claudia, Azanza Ricardo, Cristy Leonor, Valentini, Matteo, Biccari, Francesco, Müller, Melanie, Rebuffi, Luca, Esposito, Emilia, Mangiapane, Pietro, Scardi, Paolo, Mittiga, Alberto

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Thermoelectric performance in disordered Cu2ZnSnSe4 nanostructures driven by ultra-low thermal conductivity von Mukherjee, Binayak, Isotta, Eleonora, Malagutti, Marcelo Augusto, Lohani, Ketan, Rebuffi, Luca, Fanciulli, Carlo, Scardi, Paolo

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Manufacturability-based optical design optimization for advanced Kirkpatrick-Baez X-ray focusing mirrors von Huang, Lei, Wang, Tianyi, Yamada, Jumpei, Rebuffi, Luca, Austin, Corey, Choi, Heejoo, Kang, Hyukmo, Negi, Vipender, Kim, Daewook, Idir, Mourad

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Advanced optical simulation tools in the OASYS suite and their applications to the design of last generation synchrotron radiation beamlines von Rebuffi, Luca, Shi, Xianbo, Sanchez del Rio, Manuel

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Thermoelectric performance in disordered Cu2ZnSnSe4 nanostructures driven by ultra-low thermal conductivity von Mukherjee, Binayak, Isotta, Eleonora, Malagutti, Marcelo Augusto, Lohani, Ketan, Rebuffi, Luca, Fanciulli, Carlo, Scardi, Paolo

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OASYS: A software for beamline simulations and synchrotron virtual experiments von Rio, Manuel Sanchez del, Rebuffi, Luca

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Real-time machine-learning-driven control system of a deformable mirror for achieving aberration-free X-ray wavefronts von Rebuffi, Luca, Shi, Xianbo, Qiao, Zhi, Highland, Matthew J., Frith, Matthew G., Wojdyla, Antoine, Goldberg, Kenneth A., Assoufid, Lahsen

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A ray‐tracing algorithm for ab initio calculation of thermal load in undulator‐based synchrotron beamlines von Rebuffi, Luca, Shi, Xianbo, Sanchez del Rio, Manuel, Reininger, Ruben

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Real-time machine-learning-driven control system of a deformable mirror for achieving aberration-free X-ray wavefronts von Rebuffi, Luca, Shi, Xianbo, Qiao, Zhi, Highland, Matthew J, Frith, Matthew G, Wojdyla, Antoine, Goldberg, Kenneth A, Assoufid, Lahsen

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Real-time X-ray phase-contrast imaging using SPINNet—a speckle-based phase-contrast imaging neural network von Qiao, Zhi, Shi, Xianbo, Yao, Yudong, Wojcik, Michael J., Rebuffi, Luca, Cherukara, Mathew J., Assoufid, Lahsen

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MCX: a Synchrotron Radiation Beamline for X-ray Diffraction Line Profile Analysis von Rebuffi, Luca, Plaisier, Jasper R., Abdellatief, Mahmoud, Lausi, Andrea, Scardi, Paolo

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AutoFocus: AI-driven alignment of nanofocusing X-ray mirror systems von Rebuffi, Luca, Kandel, Saugat, Shi, Xianbo, Zhang, Runyu, Harder, Ross J., Cha, Wonsuk, Highland, Matthew J., Frith, Matthew G., Assoufid, Lahsen, Cherukara, Mathew J.

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On the reliability of powder diffraction Line Profile Analysis of plastically deformed nanocrystalline systems von Rebuffi, Luca, Troian, Andrea, Ciancio, Regina, Carlino, Elvio, Amimi, Amine, Leonardi, Alberto, Scardi, Paolo

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Possibilities on the Polar beamline at APS von Strempfer, Joerg, Kearney, Steven, Khan, Altaf, Capatina, Daniela, Shu, Deming, Reininger, Ruben, Rebuffi, Luca, Choi, Yongseong, Fabbris, Gilberto, Haskel, Daniel

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A hierarchical approach for modeling X‐ray beamlines: application to a coherent beamline von Sanchez del Rio, Manuel, Celestre, Rafael, Glass, Mark, Pirro, Giovanni, Herrera, Juan Reyes, Barrett, Ray, da Silva, Julio Cesar, Cloetens, Peter, Shi, Xianbo, Rebuffi, Luca

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