Modeling of Semiconductor Substrates for RF Applications: Part I-Static and Dynamic Physics of Carriers and Traps von Rack, M., Allibert, F., Raskin, J.-P.

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Modeling of Semiconductor Substrates for RF Applications: Part II-Parameter Impact on Harmonic Distortion von Rack, M., Allibert, F., Raskin, J.-P.

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Extrinsic mechanical size effects in thin ZrNi metallic glass films von Ghidelli, M., Gravier, S., Blandin, J.-J., Djemia, P., Mompiou, F., Abadias, G., Raskin, J.-P., Pardoen, T.

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Inter- and intragranular plasticity mechanisms in ultrafine-grained Al thin films: An in situ TEM study von Mompiou, F., Legros, M., Boé, A., Coulombier, M., Raskin, J.-P., Pardoen, T.

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Low-Loss Si-Substrates Enhanced Using Buried PN Junctions for RF Applications von Rack, M., Nyssens, L., Raskin, J.-P.

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On the Separate Extraction of Self-Heating and Substrate Effects in FD-SOI MOSFET von Nyssens, Lucas, Rack, M., Halder, A., Raskin, J.-P., Kilchytska, V.

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Novel class of nanostructured metallic glass films with superior and tunable mechanical properties von Ghidelli, M., Orekhov, A., Bassi, A. Li, Terraneo, G., Djemia, P., Abadias, G., Nord, M., Béché, A., Gauquelin, N., Verbeeck, J., Raskin, J.-P., Schryvers, D., Pardoen, T., Idrissi, H.

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Twisted Bi-Layer Graphene: Microscopic Rainbows von Campos-Delgado, J., Algara-Siller, G., Santos, C. N., Kaiser, U., Raskin, J.-P.

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Crack on a chip test method for thin freestanding films von Jaddi, S., Coulombier, M., Raskin, J.-P., Pardoen, T.

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A randomized controlled trial of duloxetine in diabetic peripheral neuropathic pain von WERNICKE, J. F, PRITCHETT, Y. L, D'SOUZA, D. N, WANINGER, A, TRAN, P, IYENGAR, S, RASKIN, J

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Inkjet-printed frequency-selective surfaces based on carbon nanotubes for ultra-wideband thin microwave absorbers von Jaiswar, R., Mederos-Henry, F., Dupont, V., Hermans, S., Raskin, J. -P., Huynen, I.

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Dislocation-mediated relaxation in nanograined columnar palladium films revealed by on-chip time-resolved HRTEM testing von Colla, M. -S., Amin-Ahmadi, B., Idrissi, H., Malet, L., Godet, S., Raskin, J. -P., Schryvers, D., Pardoen, T.

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Adhesionless and near-ideal contact behavior of graphene on Cu thin film von Hammad, M., Adjizian, J.-J., Sacré, C.-H., Huet, B., Charlier, J.-C., Raskin, J.-P., Pardoen, T.

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UTBB SOI MOSFETs analog figures of merit: Effects of ground plane and asymmetric double-gate regime von Md Arshad, M.K., Makovejev, S., Olsen, S., Andrieu, F., Raskin, J.-P., Flandre, D., Kilchytska, V.

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Analog/RF performance of multiple gate SOI devices: wideband simulations and characterization von Raskin, J.-P., Tsung Ming Chung, Kilchytska, V., Lederer, D., Flandre, D.

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Assessment of 28 nm UTBB FD-SOI technology platform for RF applications: Figures of merit and effect of parasitic elements von Kazemi Esfeh, B., Kilchytska, V., Barral, V., Planes, N., Haond, M., Flandre, D., Raskin, J.-P.

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High strength-ductility of thin nanocrystalline palladium films with nanoscale twins: On-chip testing and grain aggregate model von Colla, M.-S., Wang, B., Idrissi, H., Schryvers, D., Raskin, J.-P., Pardoen, T.

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Analysis of Back-Gate Bias Control on EVM Measurements of a Dual-Band Power Amplifier in 22 nm FD-SOI for 5G 28 and 39 GHz Applications von Nyssens, Lucas, Nabet, M., Rack, M., Bendou, Y., Wane, S., Sombrin, J. B., Raskin, J.-P., Lederer, D.

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Ellipsometry-based conductivity extraction in case of phosphorus doped polysilicon von Kemiha, A., Birouk, B., Raskin, J.-P.

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Effect of parasitic elements on UTBB FD SOI MOSFETs RF figures of merit von Md Arshad, M.K., Kilchytska, V., Emam, M., Andrieu, F., Flandre, D., Raskin, J.-P.

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