In situ manipulation of the sub gap states in hydrogenated amorphous silicon monitored by advanced application of Fourier transform photocurrent spectroscopy von Melskens, J., Schouten, M., Santbergen, R., Fischer, M., Vasudevan, R., van der Vlies, D.J., Quax, R.J.V., Heirman, S.G.M., Jäger, K., Demontis, V., Zeman, M., Smets, A.H.M.

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