Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite von HEMBACHER, S, GIESSIBL, F. J, MANNHART, J, QUATE, C. F

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Optical antennas: Resonators for local field enhancement von Crozier, K. B., Sundaramurthy, A., Kino, G. S., Quate, C. F.

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Scanning probes as a lithography tool for nanostructures von Quate, C.F.

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Atomic resolution with an atomic force microscope using piezoresistive detection von TORTONESE, M, BARRETT, R. C, QUATE, C. F

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Characterization and optimization of scan speed for tapping-mode atomic force microscopy von Sulchek, T., Yaralioglu, G. G., Quate, C. F., Minne, S. C.

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Atomic force microscope von BINNIG, G, QUATE, C. F, GERBER, C

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Automated parallel high-speed atomic force microscopy von Minne, S. C., Yaralioglu, G., Manalis, S. R., Adams, J. D., Zesch, J., Atalar, A., Quate, C. F.

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Forces in atomic force microscopy in air and water von WEISENHORN, A. L, HANSMA, P. K, ALBRECHT, T. R, QUATE, C. F

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Centimeter scale atomic force microscope imaging and lithography von Minne, S. C., Adams, J. D., Yaralioglu, G., Manalis, S. R., Atalar, A., Quate, C. F.

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Charge storage in a nitride-oxide-silicon medium by scanning capacitance microscopy von BARRETT, R. C, QUATE, C. F

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Synthesis of individual single-walled carbon nanotubes on patterned silicon wafers von Kong, Jing, Soh, Hyongsok T, Cassell, Alan M, Quate, Calvin F, Dai, Hongjie

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Imaging Crystals, Polymers, and Processes in Water with the Atomic Force Microscope von Drake, B., Prater, C. B., Weisenhorn, A. L., Gould, S. A. C., Albrecht, T. R., Quate, C. F., Cannell, D. S., Hansma, H. G., Hansma, P. K.

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Sensor for direct measurement of interaction forces in probe microscopy von Degertekin, F. L., Onaran, A. G., Balantekin, M., Lee, W., Hall, N. A., Quate, C. F.

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The AFM as a tool for surface imaging von Quate, C.F

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High-speed atomic force microscopy in liquid von Sulchek, T., Hsieh, R., Adams, J. D., Minne, S. C., Quate, C. F., Adderton, D. M.

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Atomic resolution imaging of a nonconductor by atomic force microscopy von ALBRECHT, T. R, QUATE, C. F

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Interdigital cantilevers for atomic force microscopy von Manalis, S. R., Minne, S. C., Atalar, A., Quate, C. F.

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Contact stiffness of layered materials for ultrasonic atomic force microscopy von Yaralioglu, G. G., Degertekin, F. L., Crozier, K. B., Quate, C. F.

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High-resolution micromachined interferometric accelerometer von Cooper, E. B., Post, E. R., Griffith, S., Levitan, J., Manalis, S. R., Schmidt, M. A., Quate, C. F.

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A New Scanning Probe Lithography Scheme with a Novel Metal Resist von Rolandi, M., Quate, C.F., Dai, H.

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