Kick-out diffusion of Al in 4H-SiC: an ab initio study von Huang, Yuanchao, Qian, Yixiao, Zhang, Yiqiang, Yang, Deren, Pi, Xiaodong

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Ab initio molecular dynamics simulation of structural and elastic properties of SiO2–P2O5–Al2O3–Na2O glass von Qian, Yixiao, Song, Bin, Jin, Junteng, Prayogo, Genki I., Utimula, Keishu, Nakano, Kousuke, Maezono, Ryo, Hongo, Kenta, Zhao, Gaoling

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Theoretical study on the improvement of the doping efficiency of Al in 4H-SiC by co-doping group-IVB elements von Huang, Yuanchao, Wang, Rong, Qian, Yixiao, Zhang, Yiqiang, Yang, Deren, Pi, Xiaodong

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Dislocation-related leakage-current paths of 4H silicon carbide von Gao, Wandong, Yang, Guang, Qian, Yixiao, Han, Xuefeng, Cui, Can, Pi, Xiaodong, Yang, Deren, Wang, Rong

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Computing characteristic functions of quantum work in phase space von Qian, Yixiao, Liu, Fei

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Evolution of perovskite nanocrystals in hot injection process with various ligand-rich systems von Li, Huazheng, Zhao, Gaoling, Song, Bin, Mao, Zhoujian, Qian, Yixiao, Dong, Weixia, Han, Gaorong

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Ab initio molecular dynamics simulation of structural and elastic properties of SiO 2 –P 2 O 5 –Al 2 O 3 –Na 2 O glass von Qian, Yixiao, Song, Bin, Jin, Junteng, Prayogo, Genki I., Utimula, Keishu, Nakano, Kousuke, Maezono, Ryo, Hongo, Kenta, Zhao, Gaoling

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A fourth-order, multigrid cut-cell method for solving Poisson's equation in three-dimensional irregular domains von Qian, Yixiao, Li, Weizhen, Tan, Yan, Zhang, Qinghai

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Computing characteristic functions of quantum work in phase space von Qian, Yixiao, Liu, Fei

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A fourth-order, multigrid cut-cell method for solving Poisson's equation in three-dimensional irregular domains von Qian, Yixiao, Li, Weizhen, Tan, Yan, Zhang, Qinghai

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Improving the doping efficiency of Al in 4H-SiC by co-doping group-IVB elements von Huang, Yuanchao, Wang, Rong, Qian, Yixiao, Zhang, Yiqiang, Yang, Deren, Pi, Xiaodong

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Semiconductor wafer surface roughness detection device von YANG DEREN, QIAN YIXIAO, PI XIAODONG

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Wafer surface roughness automatic detection system von YANG DEREN, QIAN YIXIAO, PI XIAODONG

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Preparation method of low-crack silicon carbide wafer and silicon carbide wafer von WANG RONG, LIU XIAOSHUANG, YANG DEREN, CHEN FANGYUAN, WANG WANTANG, QIAN YIXIAO, PI XIAODONG

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Method for measuring and calculating nitrogen concentration of silicon carbide wafer von WANG RONG, YANG DEREN, LI GUOFENG, QIAN YIXIAO, PI XIAODONG

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Method for detecting silicon carbide defects by X-ray diffractometer von WANG RONG, LI JIAJUN, YANG DEREN, GAO WANDONG, QIAN YIXIAO, PI XIAODONG

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Method, system and device for nondestructive testing of semiconductor defect evolution von WANG RONG, LI JIAJUN, YANG DEREN, GAO WANDONG, QIAN YIXIAO, PI XIAODONG

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Rapid positioning method and system of system combined with scanning probe microscope von WANG RONG, YANG DEREN, GAO WANDONG, QIAN YIXIAO, PI XIAODONG

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High-alumina phosphosilicate glass suitable for chemical strengthening and chemically toughened glass von ZHU QINGONG, ZHAO GAOLING, HAN GAORONG, QIAN YIXIAO, SONG BIN

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II-type core-shell structure quantum dot and preparation method and application thereof von ZHAO GAOLING, HAN GAORONG, QIAN YIXIAO, LU WANGWEI, ZHAN FENG

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