Analysis of electronic memory traps in the oxide-nitride-oxide structure of a polysilicon-oxide-nitride-oxide-semiconductor flash memory von Seo, Y. J., Kim, K. C., Kim, T. G., Sung, Y. M., Cho, H. Y., Joo, M. S., Pyi, S. H.

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Limitation of WSix/WN Diffusion Barrier for Tungsten Dual Polymetal Gate Memory Devices von Lim, K.-Y., Sung, M.G., Kim, Y.S., Cho, H.-J., Lee, S.-R., Jang, S.-A., Choi, S.-G., Lee, Y.-J., Oh, T.-K., Chun, Y.-S., Kim, Y.-H., Choi, K.-S., Kim, K.O., Jung, Y.-K., Koo, S.-Y., Ma, W.-K., Han, J.-H., Kim, G.-H., Kim, S.-J., Won, S.-R., Shin, S.-A., Lee, J.-K., Youn, T.-O., Kim, W., Hwang, Y.-T., Yang, H.-S., Pyi, S.-H., Kim, J.-W.

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Characterization of B2H6 Plasma Doping for Converted p+ Poly-Si Gate von Oh, Jae-Geun, Lee, J K, Hwang, S H, Cho, H J, Sohn, Y S, Sheen, D S, Pyi, S H, Lee, S W, Hahn, S H, Jeon, Y B, Fang, Z, Singh, V

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Investigation of Converted p+ poly-Si Gate Formed by B18HX+ Cluster Ion Implantation von Hwang, Sun-Hwan, Kim, D S, Joo, Y H, Oh, J G, Lee, J K, Jung, T W, Cho, H J, Sohn, Y S, Sheen, D S, Pyi, S H, Kim, Steve, Huh, T H, Krull, W A, Cho, H T

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Observation of Micro-Oxygen Precipitates in the Vicinity of the Oxidation-Induced Stacking Fault Ring and Their Effects on Thin Gate Oxide Breakdown von Kim, Hyun-Soo, Lee, Ki-Sang, Lee, Bo-Young, Yoo, Hak-Do, Pyi, Seung-Ho, Koh, Chung-Geun, Hong, Byung-Sub, Kim, Yil-Wook

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Enhancement of data retention time in DRAM using step gated asymmetric (STAR) cell transistors von Jang, M.W., Seo, M.S., Kim, Y.T., Cha, S.Y., Kim, Y.B., Kim, S.C., Rhee, J.H., Cheong, J.T., Jung, T.W., Pyi, S.H., Kim, H.G., Jeong, J.G., Park, S.K., Hong, S.J., Park, S.W.

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Sidewall oxidation behavior of dichlorosilane-based W-polycide gate von Kim, Hyeon-Soo, Lee, Sang-Moo, Yeo, In-Seok, Lee, Sang-Do, Pyi, Seung-Ho

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Roles of sidewall oxidation in the devices with shallow trench isolation von Pyi, Seung-Ho, Yeo, In-Seok, Weon, Dae-Hee, Kim, Young-Bog, Kim, Hyeon-Soo, Lee, Sahng-Kyoo

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Pulsed CVD of Tungsten Thin Film as a Nucleation Layer for Tungsten Plug-Fill von Kim, Soo-Hyun, Hwang, Eui-Sung, Han, Sang-Yup, Pyi, Seung-Ho, Kawk, Nohjung, Sohn, Hyunchul, Kim, Jinwoong, Choi, Gi Bo

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Improvement of the multi-level cell performance by a soft program method in flash memory devices von Park, Jong Kyung, Lee, Ki-Hong, Pyi, Seung Ho, Lee, Seok-Hee, Cho, Byung Jin

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Pulmonary Hypertension in Central Australia: A Community-Based Cohort Study von Haji, Kawa, Wong, Christopher X., Chandra, Nikhil, Truong, Helen, Corkill, Wendy, Kaethner, Alex, Naing, Pyi, Abeyaratne, Asanga, Brady, Stephen J., Kangaharan, Nadarajah

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Improvement of Charge Retention in Flash Memory Devices by Very Light Doping of Lanthanum into an Aluminum-Oxide Blocking Layer von Park, Jong Kyung, Lee, Seok-Hee, Oh, Jae Sub, Lee, Ki-Hong, Pyi, Seung Ho, Cho, Byung Jin

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Stable Gas-Phase Radical Cations of Dimeric Tryptophan and Tyrosine Derivatives von Ke, Yuyong, Verkerk, Udo H, Shek, P. Y. Iris, Hopkinson, Alan C, Siu, K. W. Michael

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Development, isolation and characterization of a new non-virulent mimosine-degrading Klebsiella pneumoniae strain from the rumen liquor of German steers by using IBT-Göttinger bior... von Aung, A., Ter Meulen, U., Gessler, F., Böhnel, H.

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SEMICONDUCTOR ELEMENT SEPARATION METHOD von PYI SEUNG HO

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Semiconductor device and method for isolating the same von PYI SEUNG-HO

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INHIBITION OF FARNESYL-PROTEIN TRANSFERASE BY GLIOTOXIN AND ACETYLGLIOTOXIN von PYL, DIDIER VAN DER, INOKOSHI, JUNJI, SHIOMI, KAZURO, YANG, HONG, TAKESHIMA, HIDEO, OMURA, SATOSHI

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Semiconductor device and method of manufacturing the same von LEE KI HONG, KWON OH CHUL, PYI SEUNG HO

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SEMICONDUCTOR DEVICE AND METHOD FOR ISOLATING THE SAME von PYI SEUNG-HO

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Semiconductor device and method of manufacturing the same von LEE KI HONG, PYI SEUNG HO, BIN JIN HO

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