Nanox: a miniature mechanical stress rig designed for near-field X-ray diffraction imaging techniques von Gueninchault, N., Proudhon, H., Ludwig, W.

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Insights into Plastic Localization by Crystallographic Slip from Emerging Experimental and Numerical Approaches von Stinville, J.C, Charpagne, M.A, Maaß, R, Proudhon, H, Ludwig, W, Callahan, P.G, Wang, F, Beyerlein, I.J, Echlin, M.P, Pollock, T.M

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Mechanical Fatigue Testing Under Thermal Gradient and Manufacturing Variabilities in Nickel-Based Superalloy Parts with Air-Cooling Holes von Aublet, A., Rambaudon, M., N’Guyen, F., Ryckelynck, D., Remacha, C., Cariou, R., Proudhon, H.

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Multiscale modeling of the elasto-plastic behavior of architectured and nanostructured Cu-Nb composite wires and comparison with neutron diffraction experiments von Gu, T., Medy, J.-R., Klosek, V., Castelnau, O., Forest, S., Hervé-Luanco, E., Lecouturier–Dupouy, F., Proudhon, H., Renault, P.-O., Thilly, L., Villechaise, P.

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New opportunities for 3D materials science of polycrystalline materials at the micrometre lengthscale by combined use of X-ray diffraction and X-ray imaging von Ludwig, W., King, A., Reischig, P., Herbig, M., Lauridsen, E.M., Schmidt, S., Proudhon, H., Forest, S., Cloetens, P., Roscoat, S. Rolland du, Buffière, J.Y., Marrow, T.J., Poulsen, H.F.

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Multiscale modeling of the elastic behavior of architectured and nanostructured Cu–Nb composite wires von Gu, T., Castelnau, O., Forest, S., Hervé-Luanco, E., Lecouturier, F., Proudhon, H., Thilly, L.

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Multiscale modeling of the anisotropic electrical conductivity of architectured and nanostructured Cu-Nb composite wires and experimental comparison von Gu, T., Medy, J.-R., Volpi, F., Castelnau, O., Forest, S., Hervé-Luanco, E., Lecouturier, F., Proudhon, H., Renault, P.-O., Thilly, L.

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Numerical analysis on the local mechanical fields in polycrystalline 316LN stainless steel under cyclic fatigue loading: Comparison with experimental results von Basseville, S., Cailletaud, G., Ghidossi, T., Guilhem, Y., Lacoste, E., Proudhon, H., Signor, L., Villechaise, P.

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Crystal plasticity finite element simulation of crack growth in single crystals von Li, J., Proudhon, H., Roos, A., Chiaruttini, V., Forest, S.

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Ductile crack initiation and propagation assessed via in situ synchrotron radiation-computed laminography von Morgeneyer, T.F., Helfen, L., Sinclair, I., Proudhon, H., Xu, F., Baumbach, T.

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Finite element analysis of fretting crack propagation von Proudhon, H., Basseville, S.

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Experimental and numerical analysis of toughness anisotropy in AA2139 Al-alloy sheet von Morgeneyer, T.F., Besson, J., Proudhon, H., Starink, M.J., Sinclair, I.

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Damage of semicrystalline polyamide 6 assessed by 3D X-ray tomography: From microstructural evolution to constitutive modeling von Laiarinandrasana, L, Morgeneyer, T.F, Proudhon, H, Regrain, C

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Experimental and numerical wear studies of porous Reactive Plasma Sprayed Ti–6Al–4V/TiN composite coating von Proudhon, H., Savkova, J., Basseville, S., Guipont, V., Jeandin, M., Cailletaud, G.

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Characterization of polycrystalline materials using synchrotron X-ray imaging and diffraction techniques von Ludwig, W., King, A., Herbig, M., Reischig, P., Marrow, J., Babout, L., Lauridsen, E. M., Proudhon, H., Buffière, J. Y.

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Three-dimensional visualisation of fatigue cracks in metals using high resolution synchrotron X-ray micro-tomography von Buffiere, J. Y., Ferrie, E., Proudhon, H., Ludwig, W.

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A fretting crack initiation prediction taking into account the surface roughness and the crack nucleation process volume von Proudhon, H., Fouvry, S., Buffière, J.-Y.

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Microstructural simulations of the initiation and propagation of short fretting cracks in a Ti–6Al–4V contact von Nigro, C., Sun, L., Meriaux, J., Proudhon, H.

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On the Origin of the Anisotropic Damage of X100 Line Pipe Steel: Part I—In Situ Synchrotron Tomography Experiments von Madi, Y., Garcia, J.-M., Proudhon, H., Shinohara, Y., Helfen, L., Besson, J., Morgeneyer, T. F.

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Three-dimensional study of a fretting crack using synchrotron X-ray micro-tomography von Proudhon, H., Buffière, J-Y., Fouvry, S.

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