Strain effects associated with SiO layers evaporated onto GaAs von BOOYENS, H, PROTO, G. R, BASSON, J. H

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The asymmetric deformation of GaAs single crystals von Booyens, H., Vermaak, J. S., Proto, G. R.

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The piezoresistance effect and dislocations in III-V compounds von Booyens, H., Vermaak, J. S., Proto, G. R.

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On the temperature distributions around dislocations in III-V compounds due to Joule heating von Booyens, H., Vermaak, J. S., Proto, G. R.

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Dislocations and the piezoelectric effect in III-V crystals von Booyens, H., Vermaak, J. S., Proto, G. R.

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TEM Observation in Cross-Section of Defects in a Long-Term-Degraded Ga1-xAlxAs Double-Heterostructure Injection Laser Diode von Proto, G R, Vermaak, J S

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Effect of He ion implantation on the domain structure of evaporated single-crystal Ni thin films viewed by Lorentz electron microscopy von Proto, G. R., Lawless, K. R.

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The anisotropic carrier mobility due to dislocations in III-V compounds von Booyens, H., Vermaak, J. S., Proto, G. R.

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Properties of Vanadium Dioxide Thermal Filaments von Kitchen, W. J., Proto, G. R.

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The application of laser process technology to thin film packaging von Redmond, T.F., Lankard, J.R., Balz, J.G., Proto, G.R., Wassick, T.A.

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Concerning the correlation between dielectric breakdown field strength and lattice constant in alkali halides von Couchman, P. R., Proto, G. R., Reynolds, C. L.

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TEM observation in cross section of defects in a long-term-degraded Ga1− x Al x As double-heterostructure injection laser diode von Proto, G. R., Vermaak, J. S.

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TEM observation in cross section of defects in a long-term-degraded Ga sub (1 minus x) Al x As double-heterostructure injection laser diode von Proto, G R, Vermaak, J S

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Effect of He Ion Implantation on the Domain Structure of Evaporated Single-Crystal Ni Thin Films Viewed by Lorentz Electron Microscopy von Proto, G R, Lawless, K R

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Lorentz Electron Microscopy of Domain Walls in Single-Crystal Evaporated Fe Films von Proto, G R, Lawless, K R

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A computer calculation of step coverage in SiO thin films von Proto, G.R., Blech, I.A., Hoh, P.D.

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Addendum: Dislocations and the piezoelectric effect in III–V crystals von Booyens, H., Vermaak, J. S., Proto, G. R.

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Anisotropic Carrier Mobility Due to Dislocations in III-V Compounds von Booyens, H, Vermaak, J S, Proto, G R

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Piezoresistance Effect and Dislocations in III-V Compounds von Booyens, H, Vermaak, J S, Proto, G R

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Lorentz electron microscopy of domain walls in single−crystal evaporated iron films von Proto, George R., Lawless, Kenneth R.

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