Analysis of reliability and optimization of ESD protection devices supported by modeling and simulation von Chvala, A., Donoval, D., Beno, P., Marek, J., Pribytny, P., Molnar, M.

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Electro-Thermal Analysis and Optimisation of Edge Termination of Power Diode Supported by 2-D/3-D Numerical Modelling and Simulation von Príbytný, P, Donoval, D, Chvála, A, Marek, J, Molnár, M

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Three-Dimensional Electro-Thermal Verilog-A Model of Power MOSFET for Circuit Simulation von Chvála, A, Donoval, D, Marek, J, Príbytný, P, Molnár, M, Mikolášek, M

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Electro-thermal analysis and optimization of edge termination of power diode supported by 2D numerical modeling and simulation von Pribytny, P., Donoval, D., Chvala, A., Marek, J., Molnar, M.

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Simulation study of interface traps and bulk traps in n++GaN/InAlN/AlN/GaN high electron mobility transistors von MOLNAR, M, DONOVAL, D, KUZMIK, J, MAREK, J, CHVALA, A, PRIBYTNY, P, MIKOLASEK, M, RENDEK, K, PALANKOVSKI, V

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Power transistor models with temperature dependent parasitic effects for SPICE-like circuit simulation von Chvala, A., Donoval, D., Marek, J., Pribytny, P., Molnar, M.

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2/3-D circuit electro-thermal model of power MOSFET for SPICE-like simulation von Chvala, A., Donoval, D., Marek, J., Pribytny, P., Molnar, M.

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