FTIR spectroscopy for the hermeticity assessment of micro-cavities von Veyrié, D., Lellouchi, D., Roux, J.L., Pressecq, F., Tetelin, A., Pellet, C.

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The advent of MEMS in space von Lafontan, X., Pressecq, F., Beaudoin, F., Rigo, S., Dardalhon, M., Roux, J.-L., Schmitt, P., Kuchenbecker, J., Baradat, B., Lellouchi, D., Le-Touze, C., Nicot, J.-M.

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Thermal and electrostatic reliability characterization in RF MEMS switches von Duong, Q.-H., Buchaillot, L., Collard, D., Schmitt, P., Lafontan, X., Pons, P., Flourens, F., Pressecq, F.

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Investigation on the effect of external mechanical stress on the DC characteristics of GaAs microwave devices von Adokanou, K., Inal, K., Montmitonnet, P., Pressecq, F., Bonnet, B., Muraro, J.-L.

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Impact of the space environmental conditions on the reliability of a MEMS COTS based system von SCHMITT, P, LAFONTAN, X, PRESSECQ, F, KURZ, B, OUDEA, C, ESTEVE, D, FOURNIOLS, J. Y, CAMON, H

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Design of an APS CMOS image sensor for low light level applications using standard CMOS technology von Goy, J, Courtois, B, Karam, J M, Pressecq, F

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CMOS compatible temperature sensor based on the lateral bipolar transistor for very wide temperature range applications von Bianchi, R.A., Santos, F. Vinci Dos, Karam, J.M., Courtois, B., Pressecq, F., Sifflet, S.

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Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling von Schmitt, P., Pressecq, F., Lafontan, X., Duong, Q.H., Pons, P., Nicot, J.M., Oudea, C., Estève, D., Fourniols, J.Y., Camon, H.

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Design, characterization and modelling of a CMOS magnetic field sensor von Latorre, L., Bertrand, Y., Hazard, P., Pressecq, F., Nouet, P.

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Characterization and modeling of a CMOS-compatible MEMS technology von Latorre, Laurent, Nouet, Pascal, Bertrand, Yves, Hazard, Philippe, Pressecq, Francis

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CMOS-compatible temperature sensor with digital output for wide temperature range applications von Bianchi, R.A, Karam, J.M, Courtois, B, Nadal, R, Pressecq, F, Sifflet, S

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Reliability Overview of RF MEMS Devices and Circuits von Melle, S., Flourens, F., Dubuc, D., Grenier, K., Pons, P., Pressecq, F., Kuchenbecker, J., Muraro, J.L., Bary, L., Plana, R.

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CMOS-compatible smart temperature sensors von Bianchi, R.A., Dos Santos, F.Vinci, Karam, J.M., Courtois, B., Pressecq, F., Sifflet, S.

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Mechanical qualification of RF-filters for space applications von Lafontan, X., Kuchenbecker, J., Guillon, B., Pons, P., Nerin, P., Pressecq, F., Dardalhon, M., Rigo, S.

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CMOS compatible temperature sensor based on the lateral bipolar transistor for very wide temperature range applications von Bianchi, R.A., Dos-Santos, F.V., Karam, J.M., Courtois, B., Pressecq, F., Sifflet, S.

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Reliability behavior of RF MEMS von Melle, S., Flourens, F., Dubuc, D., Grenier, K., Pons, P., Pressecq, F., Kuchenbecker, J., Muraro, J.L., Bary, L., Plana, R.

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Microwave and physical behavior of micro-machined structures on membrane for space applications von Kuchenbecker, J., Bary, L., Lafontan, X., Flourens, F., Takacs, A., Pons, P., Grenier, K., Dubuc, D., Aubert, H., Pressecq, F., Plana, R.

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MEMS failure analysis case studies using the IR-OBIRCH method - Short circuit localization in a MEMS pressure sensor von Lellouchi, D., Lafontan, X., Dhennin, J., Beaudoin, F., Pressecq, F.

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Reliability overview of RF MEMS devices and circuits von Melle, S., Flourens, F., Dubuc, D., Grenier, K., Pons, P., Pressecq, F., Kuchenbecker, J., Muraro, J.L., Bary, L., Plana, L.B.R.

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