Intra-Cell Defects Diagnosis von Sun, Z., Bosio, A., Dilillo, L., Girard, P., Pravossoudovich, S., Virazel, A., Auvray, E.

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A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and Systems von Tran, D. A., Virazel, A., Bosio, A., Dilillo, L., Girard, P., Pravossoudovich, S., Wunderlich, H.–J.

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SoC Symbolic Simulation: a case study on delay fault testing von Bosio, A., Girard, P., Pravossoudovich, S., Bernardi, P.

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An efficient fault simulation technique for transition faults in non-scan sequential circuits von Bosio, A., Girard, P., Pravossoudovich, S., Bernardi, P., Reorda, M.S.

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