Effects of the physical parameter on gate all around FET von Agarwal, Amit, Pradhan, P C, Swain, Bibhu P

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Understanding of stress and its correlation with microstructure near the layer continuous limit in nano‐scaled multilayers von Majhi, A., Pradhan, P. C., Jena, S., Singh, M. N., Nayak, M., Rai, S. K., Udupa, D. V.

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Study of lamellar multilayer grating near B K-edge and Si L-edge von Pradhan, P C, Nayak, M

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Soft X-ray Reflection Spectroscopy for Nano-Scaled Layered Structure Materials von Majhi, A., Nayak, Maheswar, Pradhan, P. C., Filatova, E. O., Sokolov, A., Schäfers, F.

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Element-specific structural analysis of Si/B4C using resonant X-ray reflectivity von Nayak, Maheswar, Pradhan, P. C., Lodha, G. S.

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Fabrication and performance of a high resolution ultra-short period W/B4C multilayer structure von Pradhan, P C, Gangir, D, Majhi, A, Nayak, M, Biswas, A, Bhattacharyya, D, Lodha, G S

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Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution von Nayak, Maheswar, Pradhan, P. C., Lodha, G. S., Sokolov, A., Schäfers, F.

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Erratum: Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution von Nayak, Maheswar, Pradhan, P. C., Lodha, G. S., Sokolov, A., Schäfers, F.

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Cross-sectional TEM specimen preparation for W/B4C multilayer sample using FIB von Mondal, Puspen, Pradhan, P. C., Tiwari, Pragya, Srivastava, A. K.

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2D Analytical Modeling of Surface Potential for GaAs based Nanowire Gate All Around MOSFET von Agarwal, Amit, Tiwari, Raushan, Ranjan, Shreya, Pradhan, P.C., Swain, B.P.

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Development of multilayer mirrors for space-based astronomical X-ray optics von Panini, Singam S., Nayak, M., Shyama Narendranath, K. C., Pradhan, P. C., Athiray, P. S., Sreekumar, P., Lodha, G. S., Tiwari, M. K.

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Factors affecting diabetes mellitus among rural geriatric population in Tigiria Block of Odisha: Findings from AHSETS study von Sethi S, Sethi S, Kshatri JS, Nayak RR, Pradhan PC, Bhoi T

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Optical performance of W/B4C multilayer mirror in the soft x-ray region von Pradhan, P. C., Majhi, A., Nayak, M.

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X-ray multilayer optics for Indus synchrotrons application von Nayak Maheswar, Pradhan, P C, Lodha, G S

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Interface study and performance of large layer pair ultra-short period W/B4C X-ray multilayer von Pradhan, P C, Nayak, M, Mondal, P, Lodha, G S

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Corrigendum: Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution von Nayak, Maheswar, Pradhan, P C, Lodha, G S, Sokolov, A, Schäfers, F

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Capacitive Micromachined Ultrasonic Transducer Based Gas Sensor Modeling and Simulation von Pradhan, P.C., Kumar, K. Senthil, Sarkar, Subir Kumar, Saha, Saral

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Evaluation of microstructure and residual stress in W/B4C multilayer optics von Majhi, A., Dilliwar, M., Pradhan, P. C., Jena, S., Nayak, M., Singh, M. N., Udupa, D. V., Sahoo, N. K.

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Element-specific structural analysis of Si/B4C using resonant X-ray reflectivity. Corrigendum von Nayak, Maheswar, Pradhan, P. C., Lodha, G. S.

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Element-specific structural analysis of Si/B 4 C using resonant X-ray reflectivity. Corrigendum von Nayak, Maheswar, Pradhan, P. C., Lodha, G. S.

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