A study of the electrochemical performance of vanadium oxide thin films grown by atmospheric pressure chemical vapour deposition von Vernardou, D., Paterakis, P., Drosos, H., Spanakis, E., Povey, I.M., Pemble, M.E., Koudoumas, E., Katsarakis, N.

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Plasma enhanced atomic layer deposition of copper: A comparison of precursors von Hagen, D.J., Connolly, J., Nagle, R., Povey, I.M., Rushworth, S., Carolan, P., Ma, P., Pemble, M.E.

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A broadband cavity ringdown spectrometer for in-situ measurements of atmospheric trace gases von Bitter, M., Ball, S. M., Povey, I. M., Jones, R. L.

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The incorporation of preformed metal nanoparticles in zinc oxide thin films using aerosol assisted chemical vapour deposition von Salaün, A., Hamilton, J.A., Iacopino, D., Newcomb, S.B., Nolan, M.G., Padmanabhan, S.C., Povey, I.M., Salaün, M., Pemble, M.E.

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Analysis of the minority carrier response of n -type and p -type Au/Ni/Al2O3/In0.53Ga0.47As/InP capacitors following an optimized (NH4)2S treatment von O’Connor, É., Monaghan, S., Cherkaoui, K., Povey, I. M., Hurley, P. K.

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Inversion in the In0.53Ga0.47As metal-oxide-semiconductor system: Impact of the In0.53Ga0.47As doping concentration von O'Connor, É., Cherkaoui, K., Monaghan, S., Sheehan, B., Povey, I. M., Hurley, P. K.

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Surface Oxide Characterization and Interface Evolution in Atomic Layer Deposition of Al2O3 on InP(100) Studied by in Situ Infrared Spectroscopy von Cabrera, W, Halls, M. D, Povey, I. M, Chabal, Y. J

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Temperature and frequency dependent electrical characterization of HfO2/InxGa1−xAs interfaces using capacitance-voltage and conductance methods von O’Connor, É., Monaghan, S., Long, R. D., O’Mahony, A., Povey, I. M., Cherkaoui, K., Pemble, M. E., Brammertz, G., Heyns, M., Newcomb, S. B., Afanas’ev, V. V., Hurley, P. K.

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Diffusion of In0.53Ga0.47As elements through hafnium oxide during post deposition annealing von Cabrera, W., Brennan, B., Dong, H., O'Regan, T. P., Povey, I. M., Monaghan, S., O'Connor, É., Hurley, P. K., Wallace, R. M., Chabal, Y. J.

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Band offsets and trap-related electron transitions at interfaces of (100)InAs with atomic-layer deposited Al2O3 von Chou, H.-Y., O'Connor, E., O'Mahony, A., Povey, I. M., Hurley, P. K., Dong, Lin, Ye, P. D., Afanas'ev, V. V., Houssa, M., Stesmans, A.

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Scalable high-k metal-insulator-metal capacitors with low leakage, high breakdown fields and improved voltage linearity von MONAGHAN, S, POVEY, I. M

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Electrically active interface defects in the In0.53Ga0.47As MOS system von Djara, V., O’Regan, T.P., Cherkaoui, K., Schmidt, M., Monaghan, S., O’Connor, É., Povey, I.M., O’Connell, D., Pemble, M.E., Hurley, P.K.

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Atomic Layer Deposition on Fabrics for Flame Resistance von O'Brien, S, Cosgrave, L, Lodge, V, Povey, I. M

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Structural analysis, elemental profiling, and electrical characterization of HfO2 thin films deposited on In0.53Ga0.47As surfaces by atomic layer deposition von Long, R. D., O’Connor, É., Newcomb, S. B., Monaghan, S., Cherkaoui, K., Casey, P., Hughes, G., Thomas, K. K., Chalvet, F., Povey, I. M., Pemble, M. E., Hurley, P. K.

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Atomic layer deposition for the fabrication of 3D photonic crystals structures: Growth of Al2O3 and VO2 photonic crystal systems von Povey, I.M., Bardosova, M., Chalvet, F., Pemble, M.E., Yates, H.M.

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Infrared and near-infrared spectroscopic probing of atomic layer deposition processes von O’Mahony, A., Pemble, M.E., Povey, I.M.

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Investigation of electron mobility in surface-channel Al2O3/In0.53Ga0.47As MOSFETs von Negara, M.A., Djara, V., O’Regan, T.P., Cherkaoui, K., Burke, M., Gomeniuk, Y.Y., Schmidt, M., O’Connor, E., Povey, I.M., Quinn, A.J., Hurley, P.K.

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Investigation of bulk defects in amorphous and crystalline HfO2 thin films von MODREANU, M, MONAGHAN, S, POVEY, I. M, CHERKAOUI, K, HURLEY, P. K, ANDROULIDAKI, M

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A comparison of the GaAs atomic layer deposition infiltration of photonic crystals engineered by the controlled evaporation and Langmuir–Blodgett methods von Povey, I.M., Bardosova, M., Dillon, F.C., Chalvet, F., Pemble, M.E., Thomas, K.

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Broadband lidar measurements of tropospheric water vapor profiles von South, A. M., Povey, I. M., Jones, R. L.

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