The Living With a Star Space Environment Testbed Payload von Dyer, C. S., Ryden, K. A., Morris, P. A., Hands, A. D. P., McNulty, P. J., Vaille, J. -R., Dusseau, L., Cellere, G., Paccagnella, A., Barnaby, H. J., Benedetto, A. R., Velazco, R., Bastos, R. Possamai, Brewer, D., Barth, J. L., LaBel, K. A., Campola, M. J., Zheng, Y., Xapsos, M. A.

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Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS von Dutertre, J.M., Possamai Bastos, R., Potin, O., Flottes, M.L., Rouzeyre, B., Di Natale, G., Sarafianos, A.

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Bare-Metal Redundant Multi-Threading on Multicore SoCs Under Neutron Irradiation von Serrano-Cases, A., Martinez-Alvarez, A., Bastos, R. Possamai, Cuenca-Asensi, S.

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Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode von Possamai Bastos, R., Sill Torres, F., Di Natale, G., Flottes, M., Rouzeyre, B.

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Effects of thermal neutron radiation on a hardware-implemented machine learning algorithm von Garay Trindade, M., Benevenuti, F., Letiche, M., Beaucour, J., Kastensmidt, F., Possamai Bastos, R.

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Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron-Induced Transients von Possamai Bastos, R., Dutertre, J.-M., Garay Trindade, M., Viera, R. A. C., Potin, O., Letiche, M., Cheymol, B., Beaucour, J.

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Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection von Dutertre, J.M., Possamai Bastos, R., Potin, O., Flottes, M.L., Rouzeyre, B., Di Natale, G.

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Assessing the Impacts of Radiation-Induced Soft Errors on Arm Cortex-M Microprocessors von Benevenuti, F., Gobatto, Leonardo Reinehr, Bastos, Rodrigo Possamai, Azambuja, J. R., Kastensmidt, F. L.

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Method for evaluation of transient-fault detection techniques von Camponogara Viera, R.A., Bastos, R. Possamai, Dutertre, J.-M., Maurine, P., Jadue, R. Iga

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Assessing body built-in current sensors for detection of multiple transient faults von Viera, R.A.C., Dutertre, J.-M., Flottes, M.-L., Potin, O., Natale, G. Di, Rouzeyre, B., Bastos, R. Possamai

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A bulk built-in sensor for detection of fault attacks von Possamai Bastos, R., Sill Torres, F., Dutertre, J-M, Flottes, M-L, Di Natale, G., Rouzeyre, B.

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A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults von Possamai Bastos, R., Sill Torres, F., Dutertre, J.-M, Flottes, M.-L, Di Natale, G., Rouzeyre, B.

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Comparing transient-fault effects on synchronous and on asynchronous circuits von Possamai Bastos, R., Monnet, Y., Sicard, G., Kastensmidt, F., Renaudin, M., Reis, R.

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On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits von Bastos, Rodrigo Possamai, Torres, Frank Sill

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Learning-based reliability assessment method for detection of permanent faults in clockless circuits von Aquino Guazzelli, Ricardo, Garay Trindade, Matheus, Fesquet, Laurent, Possamai Bastos, Rodrigo

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Trojan Detection Test for Clockless Circuits von Guazzelli, Ricardo Aquino, Trindade, Matheus Garay, Guimarães, Leonel Acunha, de Paiva Leite, Thiago Ferreira, Fesquet, Laurent, Bastos, Rodrigo Possamai

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Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors von de Oliveira Rocha, Raphael, Sill Torres, Frank, Bastos, Rodrigo Possamai

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Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies von Bastos, R.P., Sicard, G., Kastensmidt, F., Renaudin, M., Reis, R.

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A New Bulk Built-In Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies von Bastos, R. P., Natale, G. D., Flottes, M., Rouzeyre, B.

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Robust modular Bulk Built-in Current Sensors for detection of transient faults von Torres, F. S., Bastos, R. P.

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