Chirp signal matching and signal power optimization in pulse-echo mode ultrasonic nondestructive testing von Pollakowski, M., Ermert, H.

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The optimum bandwidth of chirp signals in ultrasonic applications von Pollakowski, M., Ermert, H., Bernus, L.von, Schmeidl, T.

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Chirp signal matching and signal power optimization in pulse-echo mode ultrasonic nondestructive testing : Special issue on correlation techniques and applications in ultrasonics von POLLAKOWSKI, M, ERMERT, H

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Pulsecompression in Pulse-Echo-Mode with Splitted Chirp Signals von Pollakowski, M., Ermert, H., von Bernus, L.

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A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies von Lubeck, J., Beckhoff, B., Fliegauf, R., Holfelder, I., Hönicke, P., Müller, M., Pollakowski, B., Reinhardt, F., Weser, J.

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Experiments and Experiences Using Filtering and Data Reduction Techniques for Imaging in Nondestructive Testing von Bernus, L. v., Mohr, F., Schmeidl, T., Ermert, H., Pollakowski, M., Kröning, M., Schmitz, V., Langenberg, K. J., Berger, M.

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Approaches to calculate the dielectric function of ZnO around the band gap von Agocs, E., Fodor, B., Pollakowski, B., Beckhoff, B., Nutsch, A., Jank, M., Petrik, P.

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High accuracy experimental determination of copper and zinc mass attenuation coefficients in the 100 eV to 30 keV photon energy range von Ménesguen, Y, Gerlach, M, Pollakowski, B, Unterumsberger, R, Haschke, M, Beckhoff, B, Lépy, M-C

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Amenity-Based Housing Affordability Indexes von Fisher, Lynn M., Pollakowski, Henry O., Zabel, Jeffrey

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A calibration procedure for a traceable contamination analysis on medical devices by combined X-ray spectrometry and ambient spectroscopic techniques von Pollakowski-Herrmann, Beatrix, Hornemann, Andrea, Giovannozzi, Andrea M, Green, Felicia, Gunning, Paul, Portesi, Chiara, Rossi, Andrea, Seim, Christian, Steven, Rory, Tyler, Bonnie, Beckhoff, Burkhard

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Characterization of ZnO structures by optical and X-ray methods von Petrik, P., Pollakowski, B., Zakel, S., Gumprecht, T., Beckhoff, B., Lemberger, M., Labadi, Z., Baji, Z., Jank, M., Nutsch, A.

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A methodological inter-comparison study on the detection of surface contaminant sodium dodecyl sulfate applying ambient- and vacuum-based techniques von Giovannozzi, Andrea M., Hornemann, Andrea, Pollakowski-Herrmann, Beatrix, Green, Felicia M., Gunning, Paul, Salter, Tara L., Steven, Rory T., Bunch, Josephine, Portesi, Chiara, Tyler, Bonnie J., Beckhoff, Burkhard, Rossi, Andrea Mario

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Evaluation of High-Resolution X-ray Absorption and Emission Spectroscopy for the Chemical Speciation of Binary Titanium Compounds von Reinhardt, F, Beckhoff, B, Eba, H, Kanngiesser, B, Kolbe, M, Mizusawa, M, Müller, M, Pollakowski, B, Sakurai, K, Ulm, G

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Focusing of soft X-ray radiation and characterization of the beam profile enabling X-ray emission spectrometry at nanolayered specimens von Unterumsberger, R., Müller, M., Beckhoff, B., Hönicke, P., Pollakowski, B., Bjeoumikhova, S.

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Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se2 absorber films von Streeck, C., Brunken, S., Gerlach, M., Herzog, C., Hönicke, P., Kaufmann, C. A., Lubeck, J., Pollakowski, B., Unterumsberger, R., Weber, A., Beckhoff, B., Kanngießer, B., Schock, H.-W., Mainz, R.

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GIXRF–NEXAFS investigations on buried ZnO/Si interfaces: A first insight in changes of chemical states due to annealing of the specimen von Pagels, M., Reinhardt, F., Pollakowski, B., Roczen, M., Becker, C., Lips, K., Rech, B., Kanngießer, B., Beckhoff, B.

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Chemical interactions in the layered system BCxNy/Ni(Cu)/Si, produced by CVD at high temperature von Hoffmann, P. S., Kosinova, M. I., Flege, S., Baake, O., Pollakowski, B., Trunova, V. A., Klein, A., Beckhoff, B., Kuznetsov, F. A., Ensinger, W.

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Silicon carbonitride nanolayers — Synthesis and chemical characterization von Hoffmann, P.S., Fainer, N.I., Baake, O., Kosinova, M.L., Rumyantsev, Y.M., Trunova, V.A., Klein, A., Pollakowski, B., Beckhoff, B., Ensinger, W.

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Chemical interactions in the layered system BC x N y /Ni(Cu)/Si, produced by CVD at high temperature von Hoffmann, P. S., Kosinova, M. I., Flege, S., Baake, O., Pollakowski, B., Trunova, V. A., Klein, A., Beckhoff, B., Kuznetsov, F. A., Ensinger, W.

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A new generation of x-ray spectrometry UHV instruments at the SR facilities BESSY II, ELETTRA and SOLEIL von Lubeck, J., Bogovac, M., Boyer, B., Detlefs, B., Eichert, D., Fliegauf, R., Grötzsch, D., Holfelder, I., Hönicke, P., Jark, W., Kaiser, R. B., Kanngießer, B., Karydas, A. G., Leani, J. J., Lépy, M. C., Lühl, L., Ménesguen, Y., Migliori, A., Müller, M., Pollakowski, B., Spanier, M., Sghaier, H., Ulm, G., Weser, J., Beckhoff, B.

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