Optimal surgical technique, use of intra-operative cholangiography (IOC), and management of acute gallbladder disease: the results of a nation-wide survey in the UK and Ireland von Sanjay, P, Kulli, C, Polignano, F M, Tait, I S

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Index laparoscopic cholecystectomy for acute admissions with cholelithiasis provides excellent training opportunities in emergency general surgery von Sanjay, P, Moore, J, Saffouri, E, Ogston, S.A, Kulli, C, Polignano, F.M, Tait, I.S

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Recurrence of Acute Colonic Pseudo-Obstruction in Selective Adrenergic Dysautonomia Associated with Infectious Toxoplasmosis von Polignano, F. M., Caradonna, P., Maiorano, E., Ferrarese, S.

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Delayed massive hemorrhage after pancreatic and biliary surgery: embolization or surgery? von Zealley, Ian A, Tait, Iain S, Polignano, Francesco M

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Proximity gettering of slow diffuser contaminants in CMOS image sensors von Russo, F., Moccia, G., Nardone, G., Alfonsetti, R., Polsinelli, G., D’Angelo, A., Patacchiola, A., Liverani, M., Pianezza, P., Lippa, T., Carlini, M., Polignano, M.L., Mica, I., Cazzini, E., Ceresoli, M., Codegoni, D.

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Analysis of the dark current distribution of complementary metal-oxide-semiconductor image sensors in the presence of metal contaminants von Polignano, M L, Russo, F, Moccia, G, Nardone, G

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Contamination by slow diffusers in ion implantation processes: The examples of molybdenum and tungsten von Polignano, M.L., Mica, I., Barbarossa, F., Galbiati, A., Grasso, S., Soncini, V.

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Tungsten contamination in ion implantation von Polignano, M.L., Barbarossa, F., Galbiati, A., Magni, D., Mica, I.

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Detection and reduction of tungsten contamination in ion implantation processes von Polignano, M. L., Galbiati, A., Grasso, S., Mica, I., Barbarossa, F., Magni, D.

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Dichromatic laser radiation effects on DNA of Escherichia coli and plasmids von Martins, W A, Polignano, G A C, Guimarães, O R, Geller, M, Paoli, F, Fonseca, A S

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DNA repair in bacterial cultures and plasmid DNA exposed to infrared laser for treatment of pain von Canuto, K S, Sergio, L P S, Marciano, R S, Guimarães, O R, Polignano, G A C, Geller, M, Paoli, F, Fonseca, A S

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Palladium contamination in silicon von Polignano, M.L., Mica, I., Ceresoli, M., Codegoni, D., Somaini, F., Bianchi, I., Volonghi, D.

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85P Real-world molecular profiling in gynaecologic oncology: Shaping tailored treatments and leveraging genetic insights to provide personalized care von Mantiero, M., Polignano, M., Bini, M., Lopez, S., Palladino, S., Piccolo, A., Vingiani, A., Agnelli, L., Duca, M., Damian, S., Tamborini, E., Perrone, F., Manoukian, S., Azzolini, J., Pruneri, G., De Braud, F.G.M., Raspagliesi, F., Ducceschi, M.

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Thermoreflectance temperature imaging of integrated circuits: calibration technique and quantitative comparison with integrated sensors and simulations von Tessier, G, Polignano, M-L, Pavageau, S, Filloy, C, Fournier, D, Cerutti, F, Mica, I

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Crystal defects and junction properties in the evolution of device fabrication technology von Mica, I, Polignano, M L, Carnevale, G, Ghezzi, P, Brambilla, M, Cazzaniga, F, Martinelli, M, Pavia, G, Bonera, E

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Making an IMPACT: A priority setting consultation exercise to improve outcomes in patients with locally advanced, recurrent and metastatic colorectal cancer von Vallance, A.E., Harji, D., Fearnhead, N.S., Acheson, A., Adams, K., Adams, R., Alsina, D., Antoniou, A., Arnott, R., Bach, S., Battersby, N., Bedford, M., Beggs, A., Belcher, E., Boulstridge, L., Boyle, K., Bradbury, J., Braun, M., Brown, E., Brown, G., Burling, D., Cameron, I., Campbell, K., Carney, K., Cecil, T., Chapman, M., Chapman, S., Chong, P., Clark, S., Crane, S., Davies, J., Davies, L., Davies, M., Dawson, C., Dawson, P., Duff, M., Demick, A., Evans, M., Fenwick, S., Galbraith, S., Gilbert, D., Griffiths, B., Hargest, R., Hill, J., Hompes, R., Huguet, E., Jenkins, J., Kapur, S., Karandikar, S., Katte, C., Kumar, N., Langman, G., Lim, M., Lopes de Azevedo-Gilbert, R., Macdonald, A., Mathur, P., Maxwell-Armstrong, C., McArthur, D., McDermott, F., McDermott, U., Mirnezami, A., Mitchell, P., Mohamed, F., Moran, B., Morris, M., Murphy, J., Nakas, A., Norris, C., O'Dwyer, S., Panagiotopoulou, I., Pellino, G., Powell, C., Renehan, A., Rowbottom, P., Sagar, P., Samuel, L., Seligmann, J., Shaikh, I., Skarrot, P., Speake, W., Stearns, A., Stylianides, N.A., Sutton, P., Swarnkar, K., Taylor, C., Tebala, G., Thorpe, G., Tiernan, J., Toogood, G., Vimalchandran, D., Walker, K., Walsh, C., Warren, O., Wasan, H., Welsh, F., Wheeler, J., Whitley, S., Wilson, M., Winter, D., Youssef, H.

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The evolution of the ion implantation damage in device processing von Polignano, M. L., Mica, I., Bontempo, V., Cazzaniga, F., Mariani, M., Mauri, A., Pavia, G., Sammiceli, F., Spoldi, G.

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Hafnium Impurity Defects in Silicon: A Characterization von Mica, I., Frascaroli, J., Vangelista, S., Caniatti, M., Piagge, R., Toia, F. F. R., Juhel, M., Polignano, M. L.

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Review-Characterization of Metal-Contamination Effects in Silicon von Polignano, M. L., Codegoni, D., Galbiati, A., Grasso, S., Mica, I., Moccia, G., Nardone, G., Russo, F.

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Analysis of Near-Surface Metal Contamination by Photoluminescence Measurements von Polignano, M. L., Galbiati, A., Mica, I., Magni, D., Cseh, D., Jay, F., Basa, P., Laurent, N., Lajtos, I., Molnar, G., Dudas, L., Roszol, L., Jastrzebski, L.

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