Extreme-ultraviolet collector mirror measurement using large reflectometer at NewSUBARU synchrotron facility von Iguchi, Haruki, Hashimoto, Hiraku, Kuki, Masaki, Harada, Tetsuo, Kinoshita, Hiroo, Watanabe, Takeo, Platonov, Yuriy Y., Kriese, Michael D., Rodriguez, Jim R.

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Depth-graded Mo/Si multilayer coatings for hard x-rays von Burcklen, Catherine, Pardini, Tom, Alameda, Jennifer, Robinson, Jeff, Platonov, Yuriy, Walton, Chris, Soufli, Regina

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Aperiodic Mo/Si multilayers for hard x-rays von Pardini, Tom, Alameda, Jennifer, Platonov, Yuriy, Robinson, Jeff, Soufli, Regina, Spiller, Eberhard, Walton, Chris, Hau-Riege, Stefan P

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Multilayer X-ray optics at CHESS von Kazimirov, Alexander, Smilgies, Detlef-M., Shen, Qun, Xiao, Xianghui, Hao, Quan, Fontes, Ernest, Bilderback, Donald H., Gruner, Sol M., Platonov, Yuriy, Martynov, Vladimir V.

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Imaging type X-ray microscope von Hirose, Raita, Platonov, Yuriy, Kato, Shuichi, Omote, Kazuhiko

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IMAGING TYPE X-RAY MICROSCOPE von KATO, Shuichi, HIROSE, Raita, OMOTE, Kazuhiko, PLATONOV, Yuriy

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IMAGING TYPE X-RAY MICROSCOPE von KATO, Shuichi, HIROSE, Raita, OMOTE, Kazuhiko, PLATONOV, Yuriy

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X-RAY DIFFRACTOMETER von OSAKABE, Takeshi, VERMAN, Boris, JIANG, Licai, OMOTE, Kazuhiko, PLATONOV, Yuriy, OZAWA, Tetsuya

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Total reflection x-ray fluorescence spectrometer von Fujimura, Hajime, Verman, Boris, Kambe, Makoto, Platonov, Yuriy, Higuchi, Toshifumi, Nonoguchi, Masahiro, Tada, Tsutomu, Jiang, Licai, Omote, Kazuhiko

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TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER von FUJIMURA, Hajime, NONOGUCHI, Masahiro, KAMBE, Makoto, VERMAN, Boris, JIANG, Licai, OMOTE, Kazuhiko, PLATONOV, Yuriy, HIGUCHI, Toshifumi, TADA, Tsutomu

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TOTAL INTERNAL REFLECTION FLUORESCENT X-RAY ANALYZER von FUJIMURA, Hajime, NONOGUCHI, Masahiro, KAMBE, Makoto, VERMAN, Boris, JIANG, Licai, OMOTE, Kazuhiko, PLATONOV, Yuriy, HIGUCHI, Toshifumi, TADA, Tsutomu

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TOTAL INTERNAL REFLECTION FLUORESCENT X-RAY ANALYZER von FUJIMURA, Hajime, NONOGUCHI, Masahiro, KAMBE, Makoto, VERMAN, Boris, JIANG, Licai, OMOTE, Kazuhiko, PLATONOV, Yuriy, HIGUCHI, Toshifumi, TADA, Tsutomu

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IMAGE FORMING TYPE X-RAY MICROSCOPE von YURIY PLATONOV, HIROSE RAITA, KATO SHUICHI, OMOTE KAZUHIKO

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MULTICONFIGURATION X-RAY OPTICAL SYSTEM von JIANG, LICAI, VERMAN, BORIS, PLATONOV, YURIY

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Semiconductor inspecting device, semiconductor inspecting system, and semiconductor inspecting method von OMOTE, KAZUHIKO, KATO, SHUICHI, HIROSE, RAITA, PLATONOV, YURIY

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A Multilayer-Coated Reflection Mirror for Microfabrication von Kinoshita, Hiroo, Kimpara, Yachiyo, Watanabe, Takeo, Platonov, Yuriy, Wood, James. L.

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SEMICONDUCTOR INSPECTING DEVICE, SEMICONDUCTOR INSPECTING SYSTEM, AND SEMICONDUCTOR INSPECTING METHOD von PLATONOV Yuriy, HIROSE Raita, KATO Shuichi, OMOTE Kazuhiko

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MULTICONFIGURATION X-RAY OPTICAL SYSTEM von JIANG, LICAI, VERMAN, BORIS, PLATONOV, YURIY

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VERFAHREN UND VORRICHTUNG ZUR BESTIMMUNG VON BOR BEI DER RÖNTGENFLUORESZENZ-SPEKTROSKOPIE von PLATONOV, YURIY

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X-ray diffractometer with multilayer reflection-type monochromator von Verman, Boris, Platonov, Yuriy, Osakabe, Takeshi, Jiang, Licai, Omote, Kazuhiko, Ozawa, Tetsuya

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