Structure, defects, and strain in silicon-silicon oxide interfaces von Kovačević, Goran, Pivac, Branko

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Reactions in silicon-nitrogen plasma von Kovačević, Goran, Pivac, Branko

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Reactions in silicon-nitrogen plasmaElectronic supplementary information (ESI) available: (1) Selection of active spaces in CASPT2 calculations, (2) Cartesian coordinates of all st... von Kova evi, Goran, Pivac, Branko

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Millimeter wave photoresponse of low-dose radiation damaged silicon von Roy, Biswadev, Pivac, Branko, Vlahovic, Branislav, Wu, Marvin H.

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Study of the Interface Layers Between Si Nanoparticles and SiO 2 Matrix Deposited by e‐Gun Evaporation von Pivac, Branko, Dubček, Pavo, Dasović, Jasna, Zorc, Hrvoje, Bernstorff, Sigrid

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Study of the Interface Layers Between Si Nanoparticles and SiO2 Matrix Deposited by e‐Gun Evaporation (Phys. Status Solidi B 10/2018) von Pivac, Branko, Dubček, Pavo, Dasović, Jasna, Zorc, Hrvoje, Bernstorff, Sigrid

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Study of the Interface Layers Between Si Nanoparticles and SiO 2 Matrix Deposited by e‐Gun Evaporation (Phys. Status Solidi B 10/2018) von Pivac, Branko, Dubček, Pavo, Dasović, Jasna, Zorc, Hrvoje, Bernstorff, Sigrid

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Reconstructed graphene nanoribbon as a sensor for nitrogen based molecules von Jaiswal, Neeraj K., Kovačević, Goran, Pivac, Branko

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Stress Evolution during Ge Nanoparticles Growth in a SiO 2 Matrix von Pivac, Branko, Dubček, Pavo, Dasović, Jasna, Popović, Jasminka, Radić, Nikola, Bernstorff, Sigrid, Zavašnik, Janez, Vlahovic, Branislav

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GISAXS Analysis of the In-Depth Morphology of Thick PS‑b‑PMMA Films von Ferrarese Lupi, Federico, Giammaria, Tommaso Jacopo, Seguini, Gabriele, Laus, Michele, Dubček, Pavo, Pivac, Branko, Bernstorff, Sigrid, Perego, Michele

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Study of the Interface Layers Between Si Nanoparticles and SiO2 Matrix Deposited by e‐Gun Evaporation von Pivac, Branko, Dubček, Pavo, Dasović, Jasna, Zorc, Hrvoje, Bernstorff, Sigrid

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Nucleation simulation using a model of hard/soft discs von Milanović, Željka, Pivac, Branko, Zulim, Ivan

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Influence of stress on the properties of Ge nanocrystals in an SiO sub(2) matrix von Pivac, Branko, Dubcek, Pavo, Popovic, Jasminka, Dasovic, Jasna, Bernstorff, Sigrid, Radic, Nikola, Zavasnik, Janez

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Influence of stress on the properties of Ge nanocrystals in an SiO 2 matrix von Pivac, Branko, Dubček, Pavo, Popović, Jasminka, Dasović, Jasna, Bernstorff, Sigrid, Radić, Nikola, Zavašnik, Janez

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Preface von Radić, Nikola, Milošević, Slobodan, Pivac, Branko

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Stress Evolution during Ge Nanoparticles Growth in a SiO2 Matrix von Pivac, Branko, Dubček, Pavo, Dasović, Jasna, Popović, Jasminka, Radić, Nikola, Bernstorff, Sigrid, Zavašnik, Janez, Vlahovic, Branislav

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Effects of substrate temperature on change in percolation properties of ultra thin dielectric films von Milanović, Zeljka, Zulim, Ivan, Pivac, Branko

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Development and Synchrotron‐Based Characterization of Al and Cr Nanostructures as Potential Calibration Samples for 3D Analytical Techniques von Dialameh, Masoud, Ferrarese Lupi, Federico, Hönicke, Philipp, Kayser, Yves, Beckhoff, Burkhard, Weimann, Thomas, Fleischmann, Claudia, Vandervorst, Wilfried, Dubček, Pavo, Pivac, Branko, Perego, Michele, Seguini, Gabriele, De Leo, Natascia, Boarino, Luca

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Influence of stress on the properties of Ge nanocrystals in an SiO2 matrix von Pivac, Branko, Dubček, Pavo, Popović, Jasminka, Dasović, Jasna, Bernstorff, Sigrid, Radić, Nikola, Zavašnik, Janez

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Modeling the interface between crystalline silicon and silicon oxide polymorphs von Kovačević, Goran, Pivac, Branko

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