On the suitability of non-hardened high density SRAMs for space applications von Koga, R., Crain, W.R., Crawford, K.B., Lau, D.D., Pinkerton, S.D., Yi, B.K., Chitty, R.

Volltext

Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions von Koga, R., Penzin, S.H., Crawford, K.B., Crain, W.R., Moss, S.C., Pinkerton, S.D., LaLumondiere, S.D., Maher, M.C.

Volltext

Selection of castor for divergent concentrations of ricin and Ricinus communis agglutinin von Pinkerton, S.D, Rolfe, R, Auld, D.L, Ghetie, V, Lauterbach, B.F

Volltext

Observation of single event upsets in analog microcircuits von Koga, R., Pinkerton, S.D., Moss, S.C., Mayer, D.C., LaLumondiere, S., Hansel, S.J., Crawford, K.B., Crain, W.R.

Volltext

Registration of TTU-LRC castor germplasm with reduced levels of ricin and RC[A.sub.120] von Auld, D.L, Pinkerton, S.D, Boroda, E, Lombard, K.A, Murphy, C.K, Kenworthy, K.E, Becker, W.D, Rolfe, R.D, Ghetie, V

Volltext

Registration of TTU‐LRC Castor Germplasm with Reduced Levels of Ricin and RCA 120 von Auld, D.L., Pinkerton, S.D., Boroda, E., Lombard, K.A., Murphy, C.K., Kenworthy, K.E., Becker, W.D., Rolfe, R.D., Ghetie, V.

Volltext

Registration of TTU‐LRC Castor Germplasm with Reduced Levels of Ricin and RCA120 von Auld, D.L., Pinkerton, S.D., Boroda, E., Lombard, K.A., Murphy, C.K., Kenworthy, K.E., Becker, W.D., Rolfe, R.D., Ghetie, V.

Volltext

Single-word multiple-bit upsets in static random access devices von Koga, R., Pinkerton, S.D., Lie, T.J., Crawford, K.B.

Volltext

Low dose rate proton irradiation of quartz crystal resonators von Koga, R., Looper, M.D., Pinkerton, S.D., Stapor, W.J., McDonald, P.T.

Volltext

Ion-induced sustained high current condition in a bipolar device von Koga, R., Ferro, R.J., Mabry, D.J., Pinkerton, S.D., Romeo, D.E., Scarpulla, J.R., Tsubota, T.K., Shoga, M.

Volltext

Serendipitous SEU hardening of resistive load SRAMs von Koga, R., Kirshman, J.F., Pinkerton, S.D., Hansel, S.J., Crawford, K.B., Crain, W.R.

Volltext

Data processing algorithms for on-board satellite event analysis von Pinkerton, S.D., Koga, R., Katz, N.

Volltext

Ion induced charge collection and SEU sensitivity of emitter coupled logic (ECL) devices von Koga, R., Crain, W.R., Hansel, S.J., Crawford, K.B., Kirshman, J.F., Pinkerton, S.D., Penzin, S.H., Moss, S.C., Maher, M.

Volltext

The impact of ASIC devices on the SEU vulnerability of space-borne computers von Koga, R., Crain, W.R., Crawford, K.B., Hansel, S.J., Pinkerton, S.D., Tsubota, T.K.

Volltext

Advantages of the LBL 88-inch cyclotron ion beams for SEP studies von Koga, R., Pinkerton, S.D.

Volltext bestellen

Bevalac ion beam characterizations for single event phenomena von Koga, R., Katz, N., Pinkerton, S.D., Kolasinski, W.A., Oberg, D.L.

Volltext

SEU and latchup tolerant advanced CMOS technology von Koga, R., Crawford, K.B., Hansel, S.J., Johnson, B.M., Lau, D.D., Penzin, S.H., Pinkerton, S.D., Maher, M.C.

Volltext

Data processing algorithms for on-board satellite event analysis von Pinkerton, S.D., Koga, R., Katz, N.

Volltext bestellen

Serendipitous SEU hardening of resistive load SRAMs von Koga, R., Kirshman, J.F., Pinkerton, S.D., Hansel, S.J., Crawford, K.B., Crain, W.R.

Volltext bestellen

Single ion induced multiple-bit upset in IDT 256K SRAMs von Koga, R., Crawford, K.B., Grant, P.B., Kolasinski, W.A., Leung, D.L., Lie, T.J., Mayer, D.C., Pinkerton, S.D., Tsubota, T.K.

Volltext bestellen