Analysis, Design, Modeling, and Characterization of Low-Loss Scalable On-Chip Transformers von Tiemeijer, L. F., Pijper, R. M. T., Andrei, C., Grenados, E.

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Two Multiport De-Embedding Methods for Accurate On-Wafer Characterization of 60-GHz Differential Amplifiers von Tiemeijer, Luuk F, Pijper, Ralf M T, van der Heijden, Edwin

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Complete On-Wafer Noise-Figure Characterization of 60-GHz Differential Amplifiers von Tiemeijer, Luuk F, Pijper, Ralf M T, van der Heijden, Edwin

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RF-Noise Modeling in Advanced CMOS Technologies von Smit, Geert D. J., Scholten, Andries J., Pijper, Ralf M. T., Tiemeijer, Luuk F., van der Toorn, Ramses, Klaassen, Dirk B. M.

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Experimental Demonstration and Modeling of Excess RF Noise in Sub-100-nm CMOS Technologies von Smit, Geert D J, Scholten, Andries J, Pijper, Ralf M T, van Langevelde, Ronald, Tiemeijer, Luuk F, Klaassen, Dirk B M

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A New 12-Term OpenaShortaLoad De-Embedding Method for Accurate On-Wafer Characterization of RF MOSFET Structures von Tiemeijer, Luuk F, Pijper, Ralf MT, van Steenwijk, JAnne, van der Heijden, Edwin

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