Effect of Arc Energy Absorber in a Wind Turbine Switch Unit von Anantavanich, K., Pietsch, G. J., Uzelac, N., Milovac, P., Wang, B.

Volltext

Calculation of pressure rise due to arcing faults von Friberg, G., Pietsch, G.J.

Volltext

SO2 removal from air with dielectric barrier discharges von Saveliev, A B, Pietsch, G J, Murtazin, A R, Fried, A

Volltext

Peculiarities of Dielectric Barrier Discharges von Pietsch, G.J.

Volltext

Hydrogen on Si : ubiquitous surface termination after wet-chemical processing von PIETSCH, G. J

Volltext

Influence of solid dielectric on the impulse discharge behaviour in a needle-to-plane air gap von Timatkov, V V, Pietsch, G J, Saveliev, A B, Sokolova, M V, Temnikov, A G

Volltext

Dielectric barrier discharges and ozone synthesis von Pietsch, G. J., Gibalov, V. I.

Volltext

Anisotropic etching versus interaction of atomic steps : scanning tunneling microscopy observations on HF/NH4F-treated Si(111) von PIETSCH, G. J, KÖHLER, U, HENZLER, M

Volltext

Dynamics of dielectric barrier discharges in different arrangements von Gibalov, Valentin I, Pietsch, Gerhard J

Volltext

Chemomechanical polishing of silicon: Surface termination and mechanism of removal von Pietsch, G. J., Higashi, G. S., Chabal, Y. J.

Volltext

Infrared-absorption spectroscopy of Si(100) and Si(111) surfaces after chemomechanical polishing von Pietsch, G. J., Chabal, Y. J., Higashi, G. S.

Volltext

Reduction of Bacillus Subtilis and Aspergillus Niger spores using nonthermal atmospheric gas discharges von Trompeter, F.-J., Neff, W.J., Franken, O., Heise, M., Neiger, M., Shuhai Liu, Pietsch, G.J., Saveljew, A.B.

Volltext

Calculation of pressure waves in substation buildings due to arcing faults von Dasbach, A., Pietsch, G.J.

Volltext

Enhanced cohesion of photo-oxygenated fullerene films: A new opportunity for lithography von Hebard, A. F., Eom, C. B., Fleming, R. M., Chabal, Y. J., Muller, A. J., Glarum, S. H., Pietsch, G. J., Haddon, R. C., Mujsce, A. M., Paczkowski, M. A., Kochanski, G. P.

Volltext

The atomic-scale removal mechanism during chemo-mechanical polishing of Si(100) and Si(111) von Pietsch, G.J., Chabal, Y.J., Higashi, G.S.

Volltext

Direct observation of silicon surface etching by water with scanning tunneling microscopy von Pietsch, G.J., Köhler, U., Henzler, M.

Volltext

The development of dielectric barrier discharges in gas gaps and on surfaces von Gibalov, Valentin I, Pietsch, Gerhard J

Volltext

CFD Calculation of Pressure Rise Due to Internal AC and DC Arcing in a Closed Container von Iwata, M., Tanaka, S., Ohtaka, T., Amakawa, T., Anantavanich, K., Pietsch, G. J.

Volltext

Structure of the stepped Si/SiO2 interface after thermal oxidation : investigations with scanning tunneling microscopy and spot-profile analysis of low-energy electron diffraction von PIETSCH, G. J, KÖHLER, U, JUSKO, O, HENZLER, M, HAHN, P. O

Volltext

Trench formation in surfactant mediated epitaxial film growth of Ge on Si(100) von Jusko, O., K hler, U., Pietsch, G. J., M ller, B., Henzler, M.

Volltext