A complete and computationally efficient numerical model of aplanatic solid immersion lens scanning microscope von Chen, Rui, Agarwal, Krishna, Sheppard, Colin J R, Phang, Jacob C H, Chen, Xudong

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Complete modeling of subsurface microscopy system based on aplanatic solid immersion lens von RUI CHEN, AGARWAL, Krishna, YU ZHONG, SHEPPARD, Colin J. R, PHANG, Jacob C. H, XUDONG CHEN

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Dyadic Green's function for aplanatic solid immersion lens based sub-surface microscopy von Hu, Li, Chen, Rui, Agarwal, Krishna, Sheppard, Colin J R, Phang, Jacob C H, Chen, Xudong

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Resolution of aplanatic solid immersion lens based microscopy von RUI CHEN, AGARWAL, Krishna, SHEPPARD, Colin J. R, PHANG, Jacob C. H, XUDONG CHEN

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Effect of polarization on a solid immersion lens of arbitrary thickness von LIM, Kenneth M, LEE, Gary C. F, SHEPPARD, Colin J. R, PHANG, Jacob C. H, CHEE LEONG WONG, XUDONG CHEN

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Nondestructive Defect Characterization of Saw-Damage-Etched Multicrystalline Silicon Wafers Using Scanning Electron Acoustic Microscopy von Lei Meng, Rao, S. S. P., Bhatia, C. S., Steen, S. E., Street, A. G., Phang, J. C. H.

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Analytical methods for the extraction of solar-cell single- and double-diode model parameters from I-V characteristics von Chan, D.S.H., Phang, J.C.H.

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A direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration von Chan, D.S.H., Ong, V.K.S., Phang, J.C.H.

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Single Contact Beam Induced Current Phenomena - A Review von Phang, Jacob C.H., Kolachina, S., Chan, Daniel S.H., Chin, J.M.

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Semiconductor parameters extraction using cathodoluminescence in the scanning electron microscope von Chan, D.S.H., Pey, K.L., Phang, J.C.H.

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A simulation model for cathodoluminescence in the scanning electron microscope von Phang, J.C.H., Pey, K.L., Chang, D.S.H.

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Cathodoluminescence Microscopy of Semiconductor Devices Using a Novel Detector with High Collection and Backscattered Electron Rejection Efficiency von Phang, Jacob C.H., Liu, X., Chan, Daniel S.H., Liu, Yan Yi, Chim, W.K.

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A method for the direct measurement of solar cell shunt resistance von Chan, D.S.H., Phang, J.C.H.

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Method and system for measuring laser induced phenomena changes in a semiconductor device von KOH LIAN S, PHANG JACOB C.H, NG HOO Y, CHUA CHOON M, TAN SOON H

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Rotational stage for high speed, large area scanning in focused beam systems von PHANG JACOB C.H, CHAN DANIEL S.H, LIU YONG YU

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Rotational stage for high speed, large area scanning in focused beam systems von PHANG JACOB C.H, CHAN DANIEL S.H, LIU YONG YU

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A review of curve fitting error criteria for solar cell I–V characteristics von Phang, Jacob C.H., Chan, Daniel S.H.

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