Complete modeling of subsurface microscopy system based on aplanatic solid immersion lens von RUI CHEN, AGARWAL, Krishna, YU ZHONG, SHEPPARD, Colin J. R, PHANG, Jacob C. H, XUDONG CHEN

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Resolution of aplanatic solid immersion lens based microscopy von RUI CHEN, AGARWAL, Krishna, SHEPPARD, Colin J. R, PHANG, Jacob C. H, XUDONG CHEN

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Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current von Meng, L., Nagalingam, D., Bhatia, C.S., Street, A.G., Phang, J.C.H.

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Single-image signal-to-noise ratio estimation von Thong, J. T. L., Sim, K. S., Phang, J. C. H.

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Determination of secondary electron yield from insulators due to a low-kV electron beam von Yong, Y. C., Thong, J. T. L., Phang, J. C. H.

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Effect of shot noise and secondary emission noise in scanning electron microscope images von Sim, K. S., Thong, J. T. L., Phang, J. C. H.

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Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror optics von Chan, D. S. H., Liu, Y. Y., Phang, J. C. H., Rau, E., Sennov, R., Gostev, A. V.

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Failure analysis of integrated devices by scanning thermal microscopy (SThM) von Fiege, G.B.M., Feige, V., Phang, J.C.H, Maywald, M., Gorlich, S., Balk, L.J.

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Ion beam induced charge microscopy studies of power diodes von Zmeck, M, Balk, L J, Osipowicz, T, Watt, F, Phang, J C H, Khambadkone, A M, Niedernostheide, F-J, Schulze, H-J

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A Near-Infrared, Continuous Wavelength, In-Lens Spectroscopic Photon Emission Microscope System von Tan, S., Toh, K., Jch Phang, Dsh Chan, Cm Chua, Koh, L.

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A direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration von Chan, D.S.H., Ong, V.K.S., Phang, J.C.H.

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Single contact beam induced current phenomenon for microelectronic failure analysis von Phang, JCH, Chan, DSH, Ong, VKS, Kolachina, S, Chin, JM, Palaniappan, M, Gilfeather, G, Seah, YX

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Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy von Hendarto, E., Altes, A., Heiderhoff, R., Phang, J.C.H., Balk, L.J.

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A comparative study of extraction methods for solar cell model parameters von Chan, D.S.H., Phillips, J.R., Phang, J.C.H.

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The properties of 2.7 eV cathodoluminescence from SiO2 film on Si substrate von Liu, X, Phang, J C H, Chan, D S H, Chim, W K

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Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device von Heiderhoff, R., Palaniappan, M., Phang, J.C.H., Balk, L.J.

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Single contact electron beam induced currents (SCEBIC) in semiconductor junctions. Part I: Quantitative verification of SCEBIC model von Kolachina, S., Phang, J.C.H., Chan, D.S.H.

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Comparison between standard and near-field cathodoluminescence von Heiderhoff, R, Sergeev, O.V, Liu, Y.Y, Phang, J.C.H, Balk, L.J

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Evaluation of electrical stress effects on SiO2–Si structures using scanning electron microscope cathodoluminescence von Liu, X., Chan, D. S. H., Chim, W. K., Phang, J. C. H.

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Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting Diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM) von Lee, T.H., Guo, X., Shen, G.D., Ji, Y., Wang, G.H., Du, J.Y., Wang, X.Z., Gao, G., Altes, A., Balk, L.J., Phang, J.C.H.

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