Analytical methods for the extraction of solar-cell single- and double-diode model parameters from I-V characteristics von Chan, D.S.H., Phang, J.C.H.

Volltext

Application and modeling of single contact electron beam induced current technique on multicrystalline silicon solar cells von Meng, L., Street, A.G., Phang, J.C.H., Bhatia, C.S.

Volltext

Failure analysis of integrated devices by scanning thermal microscopy (SThM) von Fiege, G.B.M., Feige, V., Phang, J.C.H, Maywald, M., Gorlich, S., Balk, L.J.

Volltext

Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current von Meng, L., Nagalingam, D., Bhatia, C.S., Street, A.G., Phang, J.C.H.

Volltext

Negative backside thermoreflectance modulation of microscale metal interconnects von TEO, J. K. J, CHUA, C. M, KOH, L. S, PHANG, J. C. H

Volltext

Characterization of electronic materials and devices by scanning near-field microscopy von Balk, L.J., Heiderhoff, R., Phang, J.C.H., Thomas, Ch

Volltext

Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations von Tiedemann, A.-K., Kurz, K., Fakhri, M., Heiderhoff, R., Phang, J.C.H., Balk, L.J.

Volltext

Near-field detection of photon emission from silicon with 30 nm spatial resolution von Isakov, D., Tio, A.A.B., Geinzer, T., Phang, J.C.H., Zhang, Y., Balk, L.J.

Volltext

Electron beam induced temperature oscillation for qualitative thermal conductivity analysis by an SThM/ESEM-hybrid-system von Tiedemann, A.-K., Heiderhoff, R., Balk, L.J., Phang, J.C.H.

Volltext

Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror optics von Chan, D. S. H., Liu, Y. Y., Phang, J. C. H., Rau, E., Sennov, R., Gostev, A. V.

Volltext

Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification von Ho, H.W., Zheng, X.H., Phang, J.C.H., Balk, L.J.

Volltext

Scanning near-field photon emission microscopy von Isakov, D., Geinzer, T., Tio, A., Phang, J.C.H., Zhang, Y., Balk, L.J.

Volltext

A direct method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan: planar junction configuration von Chan, D.S.H., Ong, V.K.S., Phang, J.C.H.

Volltext

Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy von Hendarto, E., Altes, A., Heiderhoff, R., Phang, J.C.H., Balk, L.J.

Volltext

Determination of Intrinsic Spectra from Frontside & Backside Photon Emission Spectroscopy von Tan, S.L., Toh, K.H., Chan, D.S.H., Phang, J.C.H., Chua, C.M., Koh, L.S.

Volltext

A comparative study of extraction methods for solar cell model parameters von Chan, D.S.H., Phillips, J.R., Phang, J.C.H.

Volltext

Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device von Heiderhoff, R., Palaniappan, M., Phang, J.C.H., Balk, L.J.

Volltext

Single contact electron beam induced currents (SCEBIC) in semiconductor junctions. Part I: Quantitative verification of SCEBIC model von Kolachina, S., Phang, J.C.H., Chan, D.S.H.

Volltext

Comparison between standard and near-field cathodoluminescence von Heiderhoff, R, Sergeev, O.V, Liu, Y.Y, Phang, J.C.H, Balk, L.J

Volltext

Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting Diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM) von Lee, T.H., Guo, X., Shen, G.D., Ji, Y., Wang, G.H., Du, J.Y., Wang, X.Z., Gao, G., Altes, A., Balk, L.J., Phang, J.C.H.

Volltext