Grain growth during selective laser melting of a Co–Cr–Mo alloy von Chen, Z. W., Phan, M. A. L., Darvish, K.

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Use of Commercial FPGA-Based Evaluation Boards for Single-Event Testing of DDR2 and DDR3 SDRAMs von Ladbury, R. L., Berg, M. D., Wilcox, E. P., LaBel, K. A., Kim, H. S., Phan, A. M., Seidleck, C. M.

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Mechanism of hot crack propagation and prevention of crack formation during electron beam powder bed fusion of a difficult-to-weld Co-Cr-Ni-W superalloy von Phan, M.A.L., Fraser, D., Gulizia, S., Chen, Z.W.

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Grain Growth During Keyhole Mode Pulsed Laser Powder Bed Fusion of IN738LC von Chen, Z. W., Guraya, T., Singamneni, S., Phan, M. A. L.

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Selection of Well Contact Densities for Latchup-Immune Minimal-Area ICs von Dodds, N A, Hutson, J M, Pellish, J A, Reed, R A, Kim, H S, Berg, M D, Friendlich, M R, Phan, A M, Seidleck, C M, Xapsos, M A, Deng, X, Baumann, R C, Schrimpf, R D, King, M P, Massengill, L W, Weller, R A

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Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions von Sierawski, B.D., Pellish, J.A., Reed, R.A., Schrimpf, R.D., Warren, K.M., Weller, R.A., Mendenhall, M.H., Black, J.D., Tipton, A.D., Xapsos, M.A., Baumann, R.C., Xiaowei Deng, Campola, M.J., Friendlich, M.R., Kim, H.S., Phan, A.M., Seidleck, C.M.

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Solidification During Selective Laser Melting of Co-29Cr-6Mo Alloy von Chen, Z. W., Guraya, T., Darvish, K., Phan, M. A. L., Pasang, T.

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Selective laser melting of Co-29Cr-6Mo alloy with laser power 180–360 W: Cellular growth, intercellular spacing and the related thermal condition von Darvish, K., Chen, Z.W., Phan, M.A.L., Pasang, T.

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The Effects of Elevated Temperature on Pulsed-Laser-Induced Single Event Transients in Analog Devices von Dakai Chen, Buchner, S.P., Phan, A.M., Kim, H.S., Sternberg, A.L., McMorrow, D., LaBel, K.A.

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Horizontal growth direction of dendritic solidification during selective electron beam melting of a Co-based alloy von Phan, M.A.L., Fraser, D., Gulizia, S., Chen, Z.W.

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Virtual pair programming and online oral exams: effects on social interaction, performance, and academic integrity in a remote computer programming course von Lubarda, M. V., Phan, A. M., Schurgers, C., Delson, N., Ghazinejad, M., Baghdadchi, S., Minnes, M., Kim, M., Pilegard, C., Relaford-Doyle, J., Sandoval, C. L., Qi, H.

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32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches von Rodbell, K. P., Heidel, D. F., Pellish, J. A., Marshall, P. W., Tang, H. H. K., Murray, C. E., LaBel, K. A., Gordon, M. S., Stawiasz, K. G., Schwank, J. R., Berg, M. D., Kim, H. S., Friendlich, M. R., Phan, A. M., Seidleck, C. M.

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Effects of Ion Atomic Number on Single-Event Gate Rupture (SEGR) Susceptibility of Power MOSFETs von Lauenstein, J.-M, Goldsman, N., Liu, S., Titus, J. L., Ladbury, R. L., Kim, H. S., Phan, A. M., LaBel, K. A., Zafrani, M., Sherman, P.

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Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing von Berg, M D, Buchner, S P, Hak Kim, Friendlich, M, Perez, C, Phan, A M, Seidleck, C M, Label, K A, Kruckmeyer, K

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Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA von O'Bryan, M. V., LaBel, K. A., Pellish, J. A., Lauenstein, J.-M, Dakai Chen, Marshall, C. J., Casey, M. C., Gigliuto, R. A., Sanders, A. B., Oldham, T. R., Kim, H. S., Phan, A. M., Berg, M. D., Marshall, P. W., Ladbury, R. L., Wilcox, E. P., Boutte, A. J., Musil, P. L., Overend, G. A.

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A Comparison of High-Energy Electron and Cobalt-60 gamma-Ray Radiation Testing von Casey, M. C., Boutte, A. J., Campola, M. J., Carts, M. A., Wilcox, E. P., Marshall, C. J., Phan, A. M., Pellish, J. A., Powell, W. A., Xapsos, M. A.

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The Effects of ELDRS at Ultra-Low Dose Rates von Chen, Dakai, Forney, J D, Pease, R L, Phan, A M, Carts, M A, Cox, S R, Kruckmeyer, K, Burns, S, Albarian, R, Holcombe, B, Little, B, Salzman, J, Chaumont, G, Duperray, H, Ouellet, A, LaBel, K

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Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems von O'Bryan, M. V., LaBel, K. A., Pellish, J. A., Lauenstein, J-M, Dakai Chen, Marshall, C. J., Oldham, T. R., Kim, H. S., Phan, A. M., Berg, M. D., Campola, M. J., Sanders, A. B., Marshall, P. W., Xapsos, M. A., Heidel, D. F., Rodbell, K. P., Swonger, J. W., Alexander, D., Gauthier, M., Gauthier, B.

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Determinants of survival following pelvic exenteration for primary rectal cancer von Radwan, R. W., Jones, H. G., Rawat, N., Davies, M., Evans, M. D., Harris, D. A., Beynon, J.

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Pelvic exenteration for advanced malignancy in elderly patients von Radwan, R. W., Evans, M. D., Davies, M., Harris, D. A., Beynon, J.

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