Broadband multilayer polarizers for the extreme ultraviolet von Wang, Zhanshan, Wang, Hongchang, Zhu, Jingtao, Wang, Fengli, Gu, Zhongxiang, Chen, Lingyan, Michette, Alan G., Powell, A. Keith, Pfauntsch, Sławka J., Schäfers, Franz

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Determination of the evolution of layer thickness errors and interfacial imperfections in ultrathin sputtered Cr/C multilayers using high-resolution transmission electron microscop... von Jiang, Hui, Michette, Alan, Pfauntsch, Slawka, Wang, Zhanshan, Zhu, Jingtao, Li, Dehui

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Broadband Mo/Si multilayer analyzers for the 15–17 nm wavelength range von Wang, Hongchang, Zhu, Jingtao, Wang, Zhanshan, Zhang, Zhong, Zhang, Shumin, Wu, Wenjuan, Chen, Lingyan, Michette, Alan G., Powell, A. Keith, Pfauntsch, Sławka J., Schäfers, Franz, Gaupp, Andreas

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Active Microstructured Optical Arrays of Grazing Incidence Reflectors von Willingale, Richard, Feldman, Charlotte, Michette, Alan, Button, Tim, Dunare, Camelia, Folkard, Melvyn, Hart, David, McFaul, Chris, Morrison, Graeme R., Parkes, William, Pfauntsch, Sławka, Powell, A. Keith, Rodriguez-Sanmartin, Daniel, Sahraei, Shahin, Shand, Matthew T., Stevenson, Tom, Vojnovic, Boris, Zhang, Dou

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Broadband Mo∕Si multilayer transmission phase retarders for the extreme ultraviolet von Wang, Zhanshan, Wang, Hongchang, Zhu, Jingtao, Zhang, Zhong, Xu, Yao, Zhang, Shumin, Wu, Wenjuan, Wang, Fengli, Wang, Bei, Liu, Liqin, Chen, Lingyan, Michette, Alan G., Pfauntsch, Slawka J., Keith Powell, A., Schäfers, Franz, Gaupp, Andreas, MacDonald, Mike

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Extreme ultraviolet broadband Mo ∕ Y multilayer analyzers von Wang, Zhanshan, Wang, Hongchang, Zhu, Jingtao, Xu, Yao, Zhang, Shumin, Li, Cunxia, Wang, Fengli, Zhang, Zhong, Wu, Yongrong, Cheng, Xinbin, Chen, Lingyan, Michette, Alan G., Pfauntsch, Slawka J., Powell, A. Keith, Schäfers, Franz, Gaupp, Andreas, MacDonald, Mike

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Characterisation of Gd2O2S:Pr phosphor screens for water window X-ray detection von Fern, George, Ireland, Terry, Silver, Jack, Withnall, Robert, Michette, Alan, McFaul, Chris, Pfauntsch, Slawka

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The influence of residual gas on boron carbide thin films prepared by magnetron sputtering von Jiang, Hui, Zhu, Jingtao, Huang, Qiushi, Xu, Jing, Wang, Xiaoqiang, Wang, Zhanshan, Pfauntsch, Slawka, Michette, Alan

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Development of piezoelectric actuators for active X-ray optics von Zhang, Dou, Rodriguez-Sanmartin, Daniel, Button, Tim W., Atkins, Carolyn, Brooks, David, Doel, Peter, Dunare, Camelia, Feldman, Charlotte, James, Ady, Michette, Alan, Parkes, William, Pfauntsch, Slawka, Sahraei, Shahin, Stevenson, Tom, Wang, Hongchang, Willingale, Richard

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Characterisation of Gd 2O 2S:Pr phosphor screens for water window X-ray detection von Fern, George, Ireland, Terry, Silver, Jack, Withnall, Robert, Michette, Alan, McFaul, Chris, Pfauntsch, Slawka

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Complete polarization analysis of extreme ultraviolet radiation with a broadband phase retarder and analyzer von Wang, Zhanshan, Wang, Hongchang, Zhu, Jingtao, Zhang, Zhong, Wang, Fengli, Xu, Yao, Zhang, Shumin, Wu, Wenjuan, Chen, Lingyan, Michette, Alan G., Pfauntsch, Slawka J., Powell, A. Keith, Schäfers, Franz, Gaupp, Andreas, Cui, Mingqi, Sun, Lijuan, MacDonald, Mike

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Broadband Mo ∕ Si multilayer transmission phase retardersfor the extreme ultraviolet von Wang, Zhanshan, Wang, Hongchang, Zhu, Jingtao, Zhang, Zhong, Xu, Yao, Zhang, Shumin, Wu, Wenjuan, Wang, Fengli, Wang, Bei, Liu, Liqin, Chen, Lingyan, Michette, Alan G., Pfauntsch, Slawka J., Keith Powell, A., Schäfers, Franz, Gaupp, Andreas, MacDonald, Mike

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Two approaches for irradiating cells individually: a charged-particle microbeam and a soft X-ray microprobe von Folkard, Melvyn, Vojnovic, Boris, Schettino, Giuseppe, Forsberg, Mats, Bowey, Graeme, Prise, Kevin M., Michael, Barry D., Michette, Alan G., Pfauntsch, Slawka J.

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