The characterization of SiGe/Si multilayers via an unambiguous solution of the inverse problem in x-ray Bragg diffraction von Nikulin, A Yu, Zaumseil, P, Petrashen', P V

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Unambiguous determination of crystal-lattice strains in epitaxially grown SiGe/Si multilayers von Nikulin, A. Yu, Zaumseil, P., Petrashen’, P. V.

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Inversion in x-ray Bragg diffraction: A practical technique to compensate for dynamical scattering features von Nikulin, A. Yu, Petrashen’, P. V.

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Possibilities of X-ray interference diffractometry for the reconstruction of two-dimensional lattice deformation profiles in crystals von Aristov, V V, Goureev, T E, Nikulin, A Yu, Petrashen, P V, Snigirev, A A

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Possibilities of X-ray interference diffractometry for the reconstruction of two-dimensional lattice deformation profiles in crystals von Aristov, V V, Goureev, T E, Nikulin, A Yu, Petrashen, P V, Snigirev, A A

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Mapping of two-dimensional lattice distortions in silicon crystals at submicrometer resolution from X-ray rocking-curve data von Nikulin, A. Yu, Sakata, O., Hashizume, H., Petrashen, P. V.

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Strain profiles in ion-doped silicon obtained from X-ray rocking curves von Kyutt, R. N., Petrashen, P. V., Sorokin, L. M.

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X-ray topography of bent crystals von Chukhovskii, F. N., Petrashen', P. V.

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Growing delta-crystals of potassium-rubidium biphthalate from aqueous solution von Moshkin, S.V., Boldyreva, O.M., Ivanova, T.I., Kuz'mina, M.A., Shakhverdova, I.P., Petrashen, P.V., Kyutt, R.N., Bradaczek, H.

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X-Ray diagnostics of 2D deformation profiles in crystals with periodically distorted near-surface region von Goureev, T. E., Yu. Nikulin, A., Petrashen, P. V.

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A general dynamical theory of the X-ray Laue diffraction from a homogeneously bent crystal von Chukhovskii, F. N., Petrashen', P. V.

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X-ray determination of the surface compression force in the ion-doped layer in silicon von Petrashen, P. V., Shulpina, I. L.

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Intensity of Laue diffracted beams in the general case of diffraction in an elastically bent crystal von Kislovskii, E. N., Petrashen, P. V.

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Mapping of two-dimensional lattice distortions in silicon crystals at submicrometer resolution from X-ray rocking-curve data. Erratum von Nikulin, A. Yu, Sakata, O., Hashizume, H., Petrashen, P. V.

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The dynamical theory of X-ray Bragg diffraction from a crystal with a uniform strain gradient. The Green-Riemann functions von Chukhovskii, F. N., Gabrielyan, K. T., Petrashen', P. V.

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Experimental study of the X-ray diffraction in a bent crystal with a large strain gradient von Petrashen, P. V., Kislovskii, E. N.

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The effect of dislocations on the Pendellösung fringes in a bent crystal von Petrashen, P. V., Yaroslavskaya, N. S.

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The physical foundations of the computer simulation of X-ray traverse topographs von Petrashen', P. V., Chukhovskii, F. N., Shulpina, I. L.

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Growing delta-crystals of potassium-rubidium biphthalate from aqueous solution von MOSHKIN, S. V, BOLDYREVA, O. M, IVANOVA, T. I, KUZ'MINA, M. A, SHAKHVERDOVA, I. P, PETRASHEN, P. V, KYUTT, R. N, BRADACZEK, H

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Possibility of solving the inverse problem of diffractive scattering with dynamic effects von DARBINYAN, S. P, PETRASHEN', P. V, CHUKHOVSKII, F. N, PARSONS, D

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