Exploring MXenes and their MAX phase precursors by electron microscopy von Alnoor, H., Elsukova, A., Palisaitis, J., Persson, I., Tseng, E.N., Lu, J., Hultman, L., Persson, P.O.Å.

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In situ He+ irradiation of the double solid solution (Ti0.5,Zr0.5)2(Al0.5,Sn0.5)C MAX phase: Defect evolution in the 350-800 °C temperature range von Tunca, B, Greaves, G, Hinks, J.A, Persson, P.O.A, Vleugels, J, Lambrinou, K

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Thermal stability of Al–Cr–N hard coatings von Willmann, H., Mayrhofer, P.H., Persson, P.O.Å., Reiter, A.E., Hultman, L., Mitterer, C.

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On the origin of a third spectral component of C1s XPS-spectra for nc-TiC/a-C nanocomposite thin films von Lewin, E., Persson, P.O.Å., Lattemann, M., Stüber, M., Gorgoi, M., Sandell, A., Ziebert, C., Schäfers, F., Braun, W., Halbritter, J., Ulrich, S., Eberhardt, W., Hultman, L., Siegbahn, H., Svensson, S., Jansson, U.

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AuAl2 and PtAl2 as potential plasmonic materials von Keast, V.J., Zwan, B., Supansomboon, S., Cortie, M.B., Persson, P.O.Å.

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Ab initio calculations and experimental study of piezoelectric Y In1−N thin films deposited using reactive magnetron sputter epitaxy von Tholander, C., Birch, J., Tasnádi, F., Hultman, L., Palisaitis, J., Persson, P.O.Å., Jensen, J., Sandström, P., Alling, B., Žukauskaitė, A.

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Oxygen incorporation in [Ti.sub.2]AlC thin films studied by electron energy loss spectroscopy and ab initio calculations von Mockute, A, Dahlqvist, M, Hultman, L, Persson, P.O.A, Rosen, J

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Structural and magnetic properties of [.sub.5][Al.sub.8] solid solution and structural relation to hexagonal nanolaminates von Mockute, A, Persson, P.O.A, Lu, J, Ingason, A.S, Magnus, F, Olafsson, S, Hultman, L, Rosen, J

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Ion-assisted physical vapor deposition for enhanced film properties on nonflat surfaces von Alami, J., Persson, P. O. Å., Music, D., Gudmundsson, J. T., Bohlmark, J., Helmersson, U.

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Oxygen incorporation in Ti2AlC thin films von Rosen, J., Persson, P. O. Å., Ionescu, M., Kondyurin, A., McKenzie, D. R., Bilek, M. M. M.

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On the origin of kinking in layered crystalline solids von Plummer, G., Rathod, H., Srivastava, A., Radovic, M., Ouisse, T., Yildizhan, M., Persson, P.O.Å., Lambrinou, K., Barsoum, M.W., Tucker, G.J.

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In situ He+ irradiation of the double solid solution (Ti0.5,Zr0.5)2(Al0.5,Sn0.5)C MAX phase: Defect evolution in the 350–800 °C temperature range von Tunca, B., Greaves, G., Hinks, J.A., Persson, P.O.Å., Vleugels, J., Lambrinou, K.

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Properties of nonpolar a-plane GaN films grown by HVPE with AlN buffers von Paskova, T., Darakchieva, V., Paskov, P.P., Birch, J., Valcheva, E., Persson, P.O.A., Arnaudov, B., Tungasmitta, S., Monemar, B.

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A solid phase reaction between Ti Cx thin films and Al2 O3 substrates von Persson, P.O.A., Rosen, Johanna, McKenzie, D.R., Bilek, M.M.M., Höglund, Carina

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Implementation of Hot-Wall MOCVD to the Growth of High-Quality GaN on SiC von Hallin, Christer, Janzén, Erik, Kakanakova-Georgieva, A., Hultman, L., Persson, P.O.Å., Birch, Jens, Pozina, G.R., Forsberg, Urban, Storasta, L.

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Role of impurities and dislocations for the unintentional n-type conductivity in InN von Darakchieva, V., Barradas, N.P., Xie, M.-Y., Lorenz, K., Alves, E., Schubert, M., Persson, P.O.Å., Giuliani, F., Munnik, F., Hsiao, C.L., Tu, L.W., Schaff, W.J.

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Growth and magnetic properties of epitaxial thin films of the i-MAX phase (Mn2/3Sc1/3)2GaC von Thorsteinsson, E.B., Dahlqvist, M., Elsukova, A., Petruhins, A., Persson, P.O.Å., Rosen, J., Ingason, A.S., Magnus, F.

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Synthesis and characterization of (Ti1-xAlx)B2+Δ thin films from combinatorial magnetron sputtering von Mockute, A., Palisaitis, J., Nedfors, N., Berastegui, P., Broitman, E., Alling, B., Näslund, L.-Å., Hultman, L., Patscheider, J., Jansson, U., Persson, P.O.Å., Rosen, J.

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Epitaxial Growth of AlN Layers on SiC Substrates in a Hot-Wall MOCVD System von Kakanakova-Georgieva, A., Persson, P.O.Å., Forsberg, U., Birch, J., Hultman, L., Janzén, E.

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Synthesis and characterisation of Mo-B-C thin films deposited by non-reactive DC magnetron sputtering von Malinovskis, P., Palisaitis, J., Persson, P.O.Å., Jansson, U., Lewin, E.

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