CEPPAD: Comprehensive energetic particle and pitch angle distribution experiment on POLAR von Blake, J. B., Fennell, J. F., Friesen, L. M., Johnson, B. M., Kolasinski, W. A., Mabry, D. J., Osborn, J. V., Penzin, S. H., Schnauss, E. R., Spence, H. E., Baker, D. N., Belian, R., Fritz, T. A., Ford, W., Laubscher, B., Stiglich, R., Baraze, R. A., Hilsenrath, M. F., Imhof, W. L., Kilner, J. R., Mobilia, J., Voss, D. H., Korth, A., G ll, M., Fisher, K., Grande, M., Hall, D.

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Single event effects in pulse width modulation controllers von Penzin, S.H., Crain, W.R., Crawford, K.B., Hansel, S.J., Kirshman, J.F., Koga, R.

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The risk of utilizing SEE sensitive COTS digital signal processor (DSP) devices in space von Koga, R., Crawford, K.B., Hansel, S.J., Crain, W.R., Penzin, S.H., Miller, S.W.

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Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions von Koga, R., Penzin, S.H., Crawford, K.B., Crain, W.R., Moss, S.C., Pinkerton, S.D., LaLumondiere, S.D., Maher, M.C.

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Ion induced charge collection and SEU sensitivity of emitter coupled logic (ECL) devices von Koga, R., Crain, W.R., Hansel, S.J., Crawford, K.B., Kirshman, J.F., Pinkerton, S.D., Penzin, S.H., Moss, S.C., Maher, M.

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SEU and latchup tolerant advanced CMOS technology von Koga, R., Crawford, K.B., Hansel, S.J., Johnson, B.M., Lau, D.D., Penzin, S.H., Pinkerton, S.D., Maher, M.C.

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Single event functional interrupt (SEFI) sensitivity in microcircuits von Koga, R., Penzin, S.H., Crawford, K.B., Crain, W.R.

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The SEU in pulse width modulation controllers with soft start and shutdown circuits von Penzin, S.H., Crain, W.R., Crawford, K.B., Hansel, S.J., Koga, R.

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Device SEE susceptibility from heavy ions (1995-1996) von Nichols, D.K., Coss, J.R., Miyahira, T.F., Schwartz, H.R., Swift, G.M., Koga, R., Crain, W.R., Crawford, K.B., Penzin, S.H.

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METHOD FOR PREPARING REFRACTORY COMPOSITION FOR SEALING CRUDE IRON TAPHOLES OF BLAST FURNACES von TSEJTLIN MARK A,SU, STEPIN GENNADIJ M,SU, BYCHIKHIN ALEKSEJ A,SU, ZAGAJNOV LEONID S,SU, VIBE GERMAN A,SU, BOJKO MIKHAIL G,SU, TUKTAMYSHEV IBRAGIM SH,SU, IGOLNITSYN ALEKSANDR N,SU, MISHIN PETR P,SU, PENZIN SERGEJ A,SU

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