ConvFusion: A Model for Layer Fusion in Convolutional Neural Networks von Waeijen, Luc, Sioutas, Savvas, Peemen, Maurice, Lindwer, Menno, Corporaal, Henk

Volltext

Leveraging AutoScript for Cross-Platform Deep Learning Solutions in Electron Microscopy von Geurts, Remco, Potocek, Pavel, Jain, Noopur, Egoavil, Ricardo, Freitag, Bert, Peemen, Maurice, Rikers, Yuri

Volltext

Artificial Intelligence‐Driven Smart Scan: A Rapid, Automatic Approach for Comprehensive Imaging and Spectroscopy for Fast Compositional Analysis von Potocek, Pavel, Ozsoy‐Keskinbora, Cigdem, Müller, Philipp, Wieczorek, Thorsten, Peemen, Maurice, Slusallek, Philipp, Freitag, Bert

Volltext

Fast Automatic Analytical Particle Analysis Using an AI Guided Smart Scan Strategy von Potocek, Pavel, Peemen, Maurice, Freitag, Bert, Müller, Philipp, Wieczorek, Thorsten

Volltext

Automatic Memory-Efficient Scheduling of CNNs von Waeijen, Luc, Sioutas, Savvas, He, Yifan, Peemen, Maurice, Corporaal, Henk

Volltext

How should a fixed budget of dwell time be spent in scanning electron microscopy to optimize image quality? von Trampert, Patrick, Bourghorbel, Faysal, Potocek, Pavel, Peemen, Maurice, Schlinkmann, Christian, Dahmen, Tim, Slusallek, Philipp

Volltext

Sparse Scanning Electron Microscopy Data Acquisition and Deep Neural Networks for Automated Segmentation in Connectomics von Potocek, Pavel, Trampert, Patrick, Peemen, Maurice, Schoenmakers, Remco, Dahmen, Tim

Volltext

Sparse Scanning Electron Microscopy and Deep Learning for Imaging and Segmentation of Neuron Structures von Dahmen, Tim, Potocek, Pavel, Trampert, Patrick, Peemen, Maurice, Schoenmakers, Remco

Volltext

Very-High Dynamic Range, 10,000 Frames/Second Pixel Array Detector for Electron Microscopy von Philipp, Hugh T., Tate, Mark W., Shanks, Katherine S., Mele, Luigi, Peemen, Maurice, Dona, Pleun, Hartong, Reinout, van Veen, Gerard, Shao, Yu-Tsun, Chen, Zhen, Thom-Levy, Julia, Muller, David A., Gruner, Sol M.

Volltext

Demystifying the 16 × 16 thread-block for stencils on the GPU von Tabik, Siham, Peemen, Maurice, Guil, Nicolas, Corporaal, Henk

Volltext

Wide Dynamic Range, 10 kHz Framing Detector for 4D-STEM von Philipp, Hugh, Tate, Mark, Shanks, Katherine, Mele, Luigi, Peemen, Maurice, Dona, Pleun, Hartong, Reinout, van Veen, Gerard, Shao, Yu-Tsun, Gruner, Sol, Thom-Levy, Julia, Muller, David

Volltext

DEEP LEARNING TECHNIQUES FOR ANALYSES OF EXPERIMENTAL DATA GENERATED BY TWO OR MORE DETECTORS von Vanrompay, Hans, Peemen, Maurice

Volltext bestellen

DEEP LEARNING TECHNIQUES FOR FAST ANOMALY DETECTION IN EXPERIMENTAL DATA von Vanrompay, Hans, Peemen, Maurice

Volltext bestellen

Efficiency Optimization of Trainable Feature Extractors for a Consumer Platform von Peemen, Maurice, Mesman, Bart, Corporaal, Henk

Volltext

METHOD IMPLEMENTED BY A DATA PROCESSING APPARATUS, AND CHARGED PARTICLE BEAM DEVICE FOR INSPECTING A SPECIMEN USING SUCH A METHOD von Schoenmakers, Remco, Peemen, Maurice, Potocek, Pavel

Volltext bestellen

APPLICATION MANAGEMENT FOR CHARGED PARTICLE MICROSCOPE DEVICES von SCHOENMAKERS, Remco, PEEMEN, Maurice, POTOCEK, Pavel

Volltext bestellen

Application Management For Charged Particle Microscope Devices von Schoenmakers, Remco, Peemen, Maurice, Potocek, Pavel

Volltext bestellen

LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PARTICLE MICROSCOPY von Peemen, Maurice, Potocek, Pavel, Freitag, Bert Henning

Volltext bestellen

LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PARTICLE MICROSCOPY von FREITAG, Bert Henning, PEEMEN, Maurice, POTOCEK, Pavel

Volltext bestellen

Charged particle microscope scan masking for three-dimensional reconstruction von Peemen, Maurice, Potocek, Pavel, Freitag, Bert Henning

Volltext bestellen