Modeling Low Dose Rate Effects in Shallow Trench Isolation Oxides von Esqueda, I. S., Barnaby, H. J., Adell, P. C., Rax, B. G., Hjalmarson, H. P., McLain, M. L., Pease, R. L.

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Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen von Pease, Ronald L, Adell, Philippe C, Rax, Bernard, McClure, Steven, Barnaby, Hugh J, Kruckmeyer, Kirby, Triggs, B

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Awards Chairman's Comments von Pease, Ronald L.

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Comparison of pMOSFET total dose response for Co-60 gammas and high-energy protons von Pease, R.L., Simons, M., Marshall, P.

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A Brief History of the NSREC von Pease, R. L.

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ELDRS in Bipolar Linear Circuits: A Review von Pease, R.L., Schrimpf, R.D., Fleetwood, D.M.

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Test structures for analyzing proton radiation effects in bipolar technologies von Barnaby, H.J., Schrimpf, R.D., Galloway, K.F., Ball, D.R., Pease, R.L., Fouillat, P.

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Modeling Single Event Transients in Bipolar Linear Circuits von Pease, R.L.

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Calculations of Radiation Dose-Rate Sensitivity of Bipolar Transistors von Hjalmarson, H.P., Pease, R.L., Devine, R.A.B.

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Electron Capture, Hydrogen Release, and Enhanced Gain Degradation in Linear Bipolar Devices von Fleetwood, D.M., Schrimpf, R.D., Pantelides, S.T., Pease, R.L., Dunham, G.W.

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Subbandgap laser-induced single event effects: carrier generation via two-photon absorption von McMorrow, D., Lotshaw, W.T., Melinger, J.S., Buchner, S., Pease, R.L.

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The Effects of Hydrogen on the Enhanced Low Dose Rate Sensitivity (ELDRS) of Bipolar Linear Circuits von Pease, R.L., Adell, P.C., Rax, B.G., Xiao Jie Chen, Barnaby, H.J., Holbert, K.E., Hjalmarson, H.P.

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Hardness assurance for space system microelectronics von Pease, Ronald L., Alexander, David R.

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Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits von Adell, P.C., Pease, R.L., Barnaby, H.J., Rax, B., Chen, X.J., McClure, S.S.

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Modeling the Dose Rate Response and the Effects of Hydrogen in Bipolar Technologies von Chen, X.J., Barnaby, H.J., Adell, P., Pease, R.L., Vermeire, B., Holbert, K.E.

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Total dose response of transconductance in MOSFETs at low temperature von Pease, R.L., Clark, S.D., Cole, P.L., Krieg, J.F., Pickel, J.C.

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Mechanisms for radiation dose-rate sensitivity of bipolar transistors von Hjalmarson, H.P., Pease, R.L., Witczak, S.C., Shaneyfelt, M.R., Schwank, J.R., Edwards, A.H., Hembree, C.E., Mattsson, T.R.

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Three-dimensional mapping of single-event effects using two photon absorption von McMorrow, D., Lotshaw, W.T., Melinger, J.S., Buchner, S., Boulghassoul, Y., Massengill, L.W., Pease, R.L.

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Common origin for enhanced low-dose-rate sensitivity and bias temperature instability under negative bias von Tsetseris, L., Schrimpf, R.D., Fleetwood, D.M., Pease, R.L., Pantelides, S.T.

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Total Dose and Dose Rate Response of an AD590 Temperature Transducer von Pease, R.L., Dunham, G.W., Seiler, J.E., Platteter, D.G., McClure, S.S.

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