Modeling Low Dose Rate Effects in Shallow Trench Isolation Oxides von Esqueda, I. S., Barnaby, H. J., Adell, P. C., Rax, B. G., Hjalmarson, H. P., McLain, M. L., Pease, R. L.

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Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen von Pease, Ronald L, Adell, Philippe C, Rax, Bernard, McClure, Steven, Barnaby, Hugh J, Kruckmeyer, Kirby, Triggs, B

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ELDRS in Bipolar Linear Circuits: A Review von Pease, R.L., Schrimpf, R.D., Fleetwood, D.M.

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A Brief History of the NSREC von Pease, R. L.

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Comparison of pMOSFET total dose response for Co-60 gammas and high-energy protons von Pease, R.L., Simons, M., Marshall, P.

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Electron Capture, Hydrogen Release, and Enhanced Gain Degradation in Linear Bipolar Devices von Fleetwood, D.M., Schrimpf, R.D., Pantelides, S.T., Pease, R.L., Dunham, G.W.

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Subbandgap laser-induced single event effects: carrier generation via two-photon absorption von McMorrow, D., Lotshaw, W.T., Melinger, J.S., Buchner, S., Pease, R.L.

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Modeling Single Event Transients in Bipolar Linear Circuits von Pease, R.L.

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Calculations of Radiation Dose-Rate Sensitivity of Bipolar Transistors von Hjalmarson, H.P., Pease, R.L., Devine, R.A.B.

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Awards Chairman's Comments von Pease, Ronald L.

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Test structures for analyzing proton radiation effects in bipolar technologies von Barnaby, H.J., Schrimpf, R.D., Galloway, K.F., Ball, D.R., Pease, R.L., Fouillat, P.

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The Effects of Hydrogen on the Enhanced Low Dose Rate Sensitivity (ELDRS) of Bipolar Linear Circuits von Pease, R.L., Adell, P.C., Rax, B.G., Xiao Jie Chen, Barnaby, H.J., Holbert, K.E., Hjalmarson, H.P.

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Common origin for enhanced low-dose-rate sensitivity and bias temperature instability under negative bias von Tsetseris, L., Schrimpf, R.D., Fleetwood, D.M., Pease, R.L., Pantelides, S.T.

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Mechanisms for radiation dose-rate sensitivity of bipolar transistors von Hjalmarson, H.P., Pease, R.L., Witczak, S.C., Shaneyfelt, M.R., Schwank, J.R., Edwards, A.H., Hembree, C.E., Mattsson, T.R.

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Three-dimensional mapping of single-event effects using two photon absorption von McMorrow, D., Lotshaw, W.T., Melinger, J.S., Buchner, S., Boulghassoul, Y., Massengill, L.W., Pease, R.L.

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Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits von Adell, P.C., Pease, R.L., Barnaby, H.J., Rax, B., Chen, X.J., McClure, S.S.

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Modeling the Dose Rate Response and the Effects of Hydrogen in Bipolar Technologies von Chen, X.J., Barnaby, H.J., Adell, P., Pease, R.L., Vermeire, B., Holbert, K.E.

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Total Dose and Dose Rate Response of an AD590 Temperature Transducer von Pease, R.L., Dunham, G.W., Seiler, J.E., Platteter, D.G., McClure, S.S.

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The Effects of Hydrogen in Hermetically Sealed Packages on the Total Dose and Dose Rate Response of Bipolar Linear Circuits von Pease, R.L., Platteter, D.G., Dunham, G.W., Seiler, J.E., Adell, P.C., Barnaby, H.J., Jie Chen

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Characterization of enhanced low dose rate sensitivity (ELDRS) effects using Gated Lateral PNP transistor structures von Pease, R.L., Platteter, D.G., Dunham, G.W., Seiler, J.E., Barnaby, H.J., Schrimpf, R.D., Shaneyfelt, M.R., Maher, M.C., Nowlin, R.N.

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