Total ionizing dose effects in bipolar devices and circuits von Pease, R.L.

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Structural Basis of Plasticity in T Cell Receptor Recognition of a Self Peptide-MHC Antigen von Garia, K. Christopher, Degano, Massimo, Pease, Larry R., Huang, Mingdong, Peterson, Per A., Teyton, Luc, Wilson, Ian A.

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Immunomodulation using the recombinant monoclonal human B7‐DC cross‐linking antibody rHIgM12 von Van Keulen, V. P., Ciric, B., Radhakrishnan, S., Heckman, K. L., Mitsunaga, Y., Iijima, K., Kita, H., Rodriguez, M., Pease, L. R.

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From Displacement Damage to ELDRS: Fifty Years of Bipolar Transistor Radiation Effects at the NSREC von Galloway, K. F., Pease, R. L., Schrimpf, R., Emily, D. W.

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Physical mechanisms contributing to enhanced bipolar gain degradation at low dose rates von Fleetwood, D.M., Kosier, S.L., Nowlin, R.N., Schrimpf, R.D., Reber, R.A., DeLaus, M., Winokur, P.S., Wei, A., Combs, W.E., Pease, R.L.

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Analytical model for proton radiation effects in bipolar devices von Barnaby, H.J., Smith, S.K., Schrimpf, R.D., Fleetwood, D.M., Pease, R.L.

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Nature of Interface Defect Buildup in Gated Bipolar Devices Under Low Dose Rate Irradiation von Chen, X.J., Barnaby, H.J., Schrimpf, R.D., Fleetwood, D.M., Pease, R.L., Platteter, D.G., Dunham, G.W.

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Modeling Total-Dose Effects for a Low-Dropout Voltage Regulator von Ramachandran, V., Narasimham, B., Fleetwood, D.M., Schrimpf, R.D., Holman, W.T., Witulski, A.F., Pease, R.L., Dunham, G.W., Seiler, J.E., Platteter, D.G.

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Preservation of motor function by inhibition of CD8+ virus peptide‐specific T cells in Theiler's virus infection von Johnson, Aaron J., Upshaw, Jadee, Pavelko, Kevin D., Rodriguez, Moses, Pease, Larry R.

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Humoral autoimmunity as a mediator of CNS repair von Bieber, Allan J, Warrington, Arthur, Pease, Larry R, Rodriguez, Moses

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Site-directed mutagenesis by overlap extension using the polymerase chain reaction von Ho, Steffan N., Hunt, Henry D., Horton, Robert M., Pullen, Jeffrey K., Pease, Larry R.

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Mechanisms of Enhanced Radiation-Induced Degradation Due to Excess Molecular Hydrogen in Bipolar Oxides von Chen, X.J., Barnaby, H.J., Vermeire, B., Holbert, K., Wright, D., Pease, R.L., Dunham, G., Platteter, D.G., Seiler, J., McClure, S., Adell, P.

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Assessment of gated sweep technique for total dose and dose rate analysis in bipolar oxides von Minson, E., Sanchez, I., Barnaby, H.J., Pease, R.L., Platteter, D.G., Dunham, G.

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Thermal-stress effects and enhanced low dose rate sensitivity in linear bipolar ICs von Shaneyfelt, M.R., Schwank, J.R., Witczak, S.C., Fleetwood, D.M., Pease, R.L., Winokur, P.S., Riewe, L.C., Hash, G.L.

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The role of parasitic elements in the single-event transient response of linear circuits von Sternberg, A.L., Massengill, L.W., Buchner, S., Pease, R.L., Boulghassoul, Y., Savage, M.W., McMorrow, D., Weller, R.A.

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Dependence of total dose response of bipolar linear microcircuits on applied dose rate von McClure, S., Pease, R.L., Will, W., Perry, G.

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Charge separation for bipolar transistors von Kosier, S.L., Schrimpf, R.D., Nowlin, R.N., Fleetwood, D.M., DeLaus, M., Pease, R.L., Combs, W.E., Wei, A., Chai, F.

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Subbandgap laser-induced single event effects: carrier generation via two-photon absorption von McMorrow, D., Lotshaw, W.T., Melinger, J.S., Buchner, S., Pease, R.L.

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Hardness assurance testing of bipolar junction transistors at elevated irradiation temperatures von Witczak, S.C., Schrimpf, R.D., Fleetwood, D.M., Galloway, K.F., Lacoe, R.C., Mayer, D.C., Puhl, J.M., Pease, R.L., Suehle, J.S.

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Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits von Adell, P.C., Pease, R.L., Barnaby, H.J., Rax, B., Chen, X.J., McClure, S.S.

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