Evidence of 2D intersubband scattering in thin film fully depleted silicon-on-insulator transistors operating at 4.2K von Casse, Mikael, Paz, Brune Cardoso, Ghibaudo, Gerard, Poiroux, Thierry, Vincent, Emmanuel, Galy, Philippe, Juge, Andre, Gaillard, Fred, de Franceschi, Silvano, Meunier, Tristan, Vinet, Maud

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