Experimental and model study of the Rh/Al system by means of EPES von Pavluch, J., Zommer, L., Polyak, Y., Pekárek, Z., Jablonski, A., Lesiak, B., Hrnčíř, T., Nehasil, V.

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Intercomparison of methods for separation of REELS elastic peak intensities for determination of IMFP von Tougaard, S., Krawczyk, M., Jablonski, A., Pavluch, J., Toth, J., Varga, D., Gergely, G., Menyhard, M., Sulyok, A.

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Influence of surface composition and density on electron inelastic mean free paths in Ge von Lesiak, B., Jablonski, A., Zemek, J., Jiricek, P., Pavluch, J.

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AES and EELS study of alumina model catalyst supports von Stará, I, Zeze, D, Matolı́n, V, Pavluch, J, Gruzza, B

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New aspects of the deexcitation mechanism in Auger electron appearance potential spectroscopy von Slezák, J, Pavluch, J

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Electron inelastic mean free paths (IMFPs) in binary Au-Cu alloys determined by elastic peak electron spectroscopy von Krawczyk, M., Zommer, L., Jablonski, A., Robert, C., Pavluch, J., Bideux, L., Gruzza, B.

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Abilities of elastic peak electron spectroscopy in the field of thin films growth investigation: Au on al and Al2O3 von ZUBER, S, NEHASIL, V, PAVLUCH, J, ROBERT, C, GRUZZA, B, MATOLIN, V

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On the interpretation of some overlayer experiments von Pavluch, J., Slezák, J., Tomková, E.

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Elastic contribution to the high-energy Auger electron appearance potential spectrum von Tilinin, I.S., Slesiak, J., Pavluch, J.

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Angular and energy distribution of backscattered electrons simulated by Monte-Carlo—Assessment by experiment I von Starý, V., Zemek, J., Pavluch, J.

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A review of recent APS experimental results on the electron scattering investigation von Pavluch, J, Slezák, J, Brechlerová, D

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Scattering of electrons in the surface region of solids studied by appearance potential spectroscopy von Pavluch, J, Slezák, J, Brechlerová, D

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On the deexcitation mechanism in Auger electron appearance potential spectroscopy von Pavluch, J., Eckertová, L.

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On the information depth of auger electron appearance potential spectroscopy von Eckertová, L., Jeníček, T., Pavluch, J.

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Experimental Comparison of the Information Depth of AEAPS, DAPS and AES von Hucek, S., Pavluch, J.

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A new appearance potential spectrometer von PAVLUCH, J, ECKERTOVA, L

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A modification of the AEAPS method von ECKERTOVA, L, PAVLUCH, J

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Abilities of elastic peak electron spectroscopy in the field of thin films growth investigation: Au on Al and Al 2O 3 von Zuber, S, Nehasil, V, Pavluch, J, Robert, C, Gruzza, B, Matolı́n, V

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Intercomparison of methods for separation of REELD elastic peak intensities for determination of IMFP von TOUGAARD, S, KRAWCZYK, M, JABLONSKI, A, PAVLUCH, J, TOTH, J, VARGA, D, GERGELY, G, MENYHARD, M, SULYOK, A

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Abilities of elastic peak electron spectroscopy in the field of thin films growth investigation: Au on Al and Al sub 2 O sub 3 von Pavluch, J, Zuber, S, Nehasil, V, Robert, C, Gruzza, B, Matolin, V

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