4H-SiC Schottky diode radiation hardness assessment by IBIC microscopy von Vittone, Ettore, Olivero, Paolo, Jakšic̈, Milko, Pastuović, Željko

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Silicon carbide diodes for neutron detection von Coutinho, José, Torres, Vitor J.B., Capan, Ivana, Brodar, Tomislav, Ereš, Zoran, Bernat, Robert, Radulović, Vladimir, Ambrožič, Klemen, Snoj, Luka, Pastuović, Željko, Sarbutt, Adam, Ohshima, Takeshi, Yamazaki, Yuichi, Makino, Takahiro

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Double negatively charged carbon vacancy at the h- and k-sites in 4H-SiC: Combined Laplace-DLTS and DFT study von Capan, Ivana, Brodar, Tomislav, Pastuović, Željko, Siegele, Rainer, Ohshima, Takeshi, Sato, Shin-ichiro, Makino, Takahiro, Snoj, Luka, Radulović, Vladimir, Coutinho, José, Torres, Vitor J. B., Demmouche, Kamel

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Silicon carbide neutron detector testing at the JSI TRIGA reactor for enhanced border and port security von Radulović, Vladimir, Yamazaki, Yuichi, Pastuović, Željko, Sarbutt, Adam, Ambrožič, Klemen, Bernat, Robert, Ereš, Zoran, Coutinho, José, Ohshima, Takeshi, Capan, Ivana, Snoj, Luka

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Deep level defects in 4H-SiC introduced by ion implantation: the role of single ion regime von Pastuovi, eljko, Siegele, Rainer, Capan, Ivana, Brodar, Tomislav, Sato, Shin-ichiro, Ohshima, Takeshi

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Heavy ion PIXE cross sections in Ti, Zn, Nb, Ru and Ta for 4.8–30.0 MeV oxygen and 3.0–12.0 MeV lithium beams von Siegele, Rainer, Cohen, David D., Pastuović̀, Zeljko

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Response of 4H-SiC Detectors to Ionizing Particles von Bernat, Robert, Capan, Ivana, Bakrač, Luka, Brodar, Tomislav, Makino, Takahiro, Ohshima, Takeshi, Pastuović, Željko, Sarbutt, Adam

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Laplace DLTS study of deep defects created in neutron-irradiated n-type 4H-SiC von Brodar, Tomislav, Capan, Ivana, Radulović, Vladimir, Snoj, Luka, Pastuović, Željko, Coutinho, José, Ohshima, Takeshi

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Silicon 3D Microdosimeters for Advanced Quality Assurance in Particle Therapy von Tran, Linh T., Bolst, David, James, Benjamin, Pan, Vladimir, Vohradsky, James, Peracchi, Stefania, Chartier, Lachlan, Debrot, Emily, Guatelli, Susana, Petasecca, Marco, Lerch, Michael, Prokopovich, Dale, Pastuović, Željko, Povoli, Marco, Kok, Angela, Inaniwa, Taku, Lee, Sung Hyun, Matsufuji, Naruhiro, Rosenfeld, Anatoly B.

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Top-down patterning of topological surface and edge states using a focused ion beam von Bake, Abdulhakim, Zhang, Qi, Ho, Cong Son, Causer, Grace L., Zhao, Weiyao, Yue, Zengji, Nguyen, Alexander, Akhgar, Golrokh, Karel, Julie, Mitchell, David, Pastuovic, Zeljko, Lewis, Roger, Cole, Jared H., Nancarrow, Mitchell, Valanoor, Nagarajan, Wang, Xiaolin, Cortie, David

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Preliminary Characterization of an Active CMOS Pad Detector for Tracking and Dosimetry in HDR Brachytherapy von Bui, Thi Ngoc Hang, Large, Matthew, Poder, Joel, Bucci, Joseph, Bianco, Edoardo, Giampaolo, Raffaele Aaron, Rivetti, Angelo, Da Rocha Rolo, Manuel, Pastuovic, Zeljko, Corradino, Thomas, Pancheri, Lucio, Petasecca, Marco

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Creating thin magnetic layers at the surface of Sb2Te3 topological insulators using a low-energy chromium ion beam von Cortie, David, Zhao, Weiyao, Yue, Zengji, Li, Zhi, Bake, Abuduliken, Marenych, Olexandra, Pastuovic, Zeljko, Nancarrow, Mitchell, Zhang, Zhaoming, Qi, Dong-Chen, Evans, Peter, Mitchell, David R. G., Wang, Xiaolin

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Radiation hardness of single crystal CVD diamond detector tested with MeV energy ions von Zamboni, Ivana, Pastuović, Željko, Jakšić, Milko

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4H-SiC Schottky Barrier Diodes for Efficient Thermal Neutron Detection von Bernat, Robert, Bakrač, Luka, Radulović, Vladimir, Snoj, Luka, Makino, Takahiro, Ohshima, Takeshi, Pastuović, Željko, Capan, Ivana

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An Insight into a Shang Dynasty Bronze Vessel by Nuclear Techniques von Salvemini, Filomena, Pastuovic, Zeljko, Stopic, Attila, Kim, Min-Jung, Gatenby, Sue

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Probability of divacancy trap production in silicon diodes exposed to focused ion beam irradiation von Pastuović, Željko, Vittone, Ettore, Capan, Ivana, Jakšić, Milko

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Depth Profile Analysis of Deep Level Defects in 4H-SiC Introduced by Radiation von Brodar, Tomislav, Bakrač, Luka, Capan, Ivana, Ohshima, Takeshi, Snoj, Luka, Radulović, Vladimir, Pastuović, Željko

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Deep Level Defects in 4H-SiC Epitaxial Layers von Siegele, Rainer, Sato, Shin Ichiro, Brodar, Tomislav, Ohshima, Takeshi, Torres, Vitor, Snoj, Luka, Makino, Takahiro, Capan, Ivana, Demmouche, Kamel, Radulović, Vladimir, Coutinho, José, Pastuovic, Željko

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A biocompatible technique for magnetic field sensing at (sub)cellular scale using Nitrogen-Vacancy centers von Bernardi, Ettore, Moreva, Ekaterina, Traina, Paolo, Petrini, Giulia, Ditalia Tchernij, Sviatoslav, Forneris, Jacopo, Pastuović, Željko, Degiovanni, Ivo Pietro, Olivero, Paolo, Genovese, Marco

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Accelerator-Based Nuclear Techniques for Processing and Characterization of Oxide Semiconductors for Solar Energy Conversion von Vittone, Ettore, Capan, Ivana, Ionescu, Mihail, Pastuovic, Željko

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